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    CCA- 2010 - 2010 IEEE International Conference on Control Applications (CCA) part of the IEEE Multi-Conference on Systems & Control (MSC)

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    Website http://www.mei.titech.ac.jp/msc10/ | Want to Edit it Edit Freely

    Category CCA- 2010

    Deadline: January 31, 2010 | Date: September 08, 2010

    Venue/Country: Yokohama, Japan

    Updated: 2010-06-04 19:32:22 (GMT+9)

    Call For Papers - CFP

    The 2010 IEEE Multi-Conference on Systems and Control (MSC), to be held at the PACIFICO YOKOHOMA, Japan, September 8-10, 2010, is comprised of three major international conferences promoted by the IEEE Control Systems Society:

    the IEEE Conference on Control Applications (CCA), initiated in 1992, with the goal of bringing together experts from academy and industry from different countries to present new research results in control applications, promoting and encouraging industrial participation in the activities of the IEEE Control Systems Society;

    the IEEE International Symposium on Computer-Aided Control System Design (CACSD), initiated in 1992 to be a place for discussion and promotion of the new developments of algorithms and software tools to be used as enabling technologies in control engineering, has evolved so to comprise all the different computational aspects of control system design. The 2010 CACSD Symposium will host a special track on Systems with Uncertainty;

    the IEEE International Symposium on Intelligent Control (ISIC), initiated in 1985, provides a unique opportunity for researchers and practitioners from different areas to discuss innovative control algorithms, also developed by emulating certain characteristics of intelligent biological systems, and recent advancements in computing technology, that may open avenues for significant technological advances.

    The conference will feature several kinds of presentations including contributed and invited papers as well as invited tutorial sessions and workshops, covering a broad range of topics relevant to control applications, methods, and development tools.


    Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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