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    ICNMS 2016 - [Ei Compendex & Scopus]2016 4th International Conference on Nano and Materials Science (ICNMS 2016)

    View: 221

    Website www.icnms.org | Want to Edit it Edit Freely

    Category Nano;Materials Science

    Deadline: November 15, 2015 | Date: January 07, 2016-January 09, 2016

    Venue/Country: New York, U.S.A

    Updated: 2015-10-27 12:04:54 (GMT+9)

    Call For Papers - CFP

    [Ei Compendex & Scopus]2016 4th International Conference on Nano and

    Materials Science (ICNMS 2016)

    January 7-9, 2016, New York, USA

    www.icnms.org

    Publication

    All accepted papers of ICNMS 2016 will be published in the volume of

    MATEC Web of Conferences (ISSN: 2261-236X), which is indexed by Ei

    Compendex, Inspec, DOAJ, CPCI (Web of Science) and Scopus.

    Submission

    ICNMS 2016 is now accepting manuscript submissions.

    Full Paper Submission Deadline: November 15, 2015

    Please submit your full paper to us: icnmsatsaise.org.

    Keynote Speakers

    Prof. Ridha Ben Mrad, University of Toronto, Canada

    Prof. Chun-Hung Chen, George Mason University, USA

    Prof. Liudong Xing, University of Massachusetts Dartmouth, USA

    Assoc. Prof. Latika Menon, Northeastern University, USA

    Conference Venue

    New York LaGuardia Airport Marriott

    Address: 102-05 Ditmars Boulevard, East Elmhurst, New York 11369 USA

    Phone: +1-718-565-8900 Fax: +1-718-898-4955

    Contact us

    MS. Amiee Zhou

    Tel:1-302-444-8432

    Email:icnmsatsaise.org

    Website:www.icnms.org


    Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
    Disclaimer: ourGlocal is an open academical resource system, which anyone can edit or update. Usually, journal information updated by us, journal managers or others. So the information is old or wrong now. Specially, impact factor is changing every year. Even it was correct when updated, it may have been changed now. So please go to Thomson Reuters to confirm latest value about Journal impact factor.