Sign for Notice Everyday    Sign Up| Sign In| Link| English|

Our Sponsors

    Receive Latest News

    Feedburner
    Share Us


    CAS 2019 - 42nd International Semiconductor Conference CAS 2019

    View: 662

    Website www.imt.ro/cas | Want to Edit it Edit Freely

    Category Nanoscience and Nanoengineering; Micro- and nanophotonics and Optoelectronics; Microwave and Millimeter Wave Circuits and Systems; Microsensors and Microsystems; Modelling; Semiconductor Devices; Integrated Circuits

    Deadline: June 03, 2019 | Date: October 09, 2019-October 11, 2019

    Venue/Country: Sinaia, Romania

    Updated: 2019-05-19 20:29:51 (GMT+9)

    Call For Papers - CFP

    https://www.imt.ro/cas/callforpapers.php

    Authors are invited to submit original papers on the following TOPICS: Nanoscience and Nanoengineering; Micro- and nanophotonics and Optoelectronics; Microwave and Millimeter Wave Circuits and Systems; Microsensors and Microsystems; Modelling; Semiconductor Devices; Integrated Circuits

    Papers submission deadline: June 03, 2019

    Details: https://www.imt.ro/cas/callforpapers.php

    The accepted papers (4 pages) will be published in the Conference Proceedings, which will be available on the IEEE Xplore Digital Library.

    Authors will have the option of submitting papers of 2 pages - these papers could be selected only for presentation at the conference and they will not be published in the Conference Proceedings.

    The program will include a special session devoted to Student papers. The best student paper will be awarded.


    Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
    Disclaimer: ourGlocal is an open academical resource system, which anyone can edit or update. Usually, journal information updated by us, journal managers or others. So the information is old or wrong now. Specially, impact factor is changing every year. Even it was correct when updated, it may have been changed now. So please go to Thomson Reuters to confirm latest value about Journal impact factor.