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    BAW-UAI09 2009 - Seventh Annual Workshop on Bayes Applicationsin conjunction with UAI/COLT/ICML

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    Website baw-uai09.intel-research.net | Want to Edit it Edit Freely

    Category BAW-UAI09 2009

    Deadline: April 20, 2009 | Date: June 18, 2009

    Venue/Country: Montreal, Canada

    Updated: 2010-06-04 19:32:22 (GMT+9)

    Call For Papers - CFP

    Bayes Applications Workshop 2009: Call for Participation

    Seventh Annual Workshop on Bayes Applications

    on Thursday 18 June, 2009

    in conjunction with UAI/COLT/ICML, Montreal, CA

    Submission Deadline: 20 April 2009

    Acceptance Notification: 16 May 2009

    Final Version Due: 13 June 2009

    The 7th annual Bayes Applications Workshop is looking for real world

    applications of graphical models and Bayes networks. We are especially

    interested in contributions that emphasize the challenges encountered in

    exploring novel domains — that are characteristic of the domain and the

    software tools used. With contributions at the border of the academic and

    non-academic community, our desire is to foster discussion and interchange.

    Accordingly, we not only seek submissions from members of the immediate

    conference community, but also strongly encourage submissions from

    practitioners from a larger community.

    Real world applications typically integrate theories and techniques from

    multiple sources, taking a systems approach. One topic of particular

    interest is how researchers and developers have reconciled apparently

    conflicting demands of theory and practice in larger systems. Further, the

    availability of mature academic and commercial software tools has spawned

    numerous applications. We'd like to reach out this year to users of such tools,

    especially those who have applied software in places and domains where they have

    not been applied before: Many of the connections among researchers and

    applications occur by virtue of software that researchers make available that is

    applied by someone working on a real world problem.

    In past years this workshop has addressed the UAI community. Now with the

    joint workshop program, the AI/ML communities have grown closer, and we invite

    participation of interested parties from all communities with an interest in

    building graphical models.

    Broad areas of interest:

    Ecological & biological systems models

    computer systems & dependability

    dialog systems

    fault isolation & root cause analysis

    conflict analysis

    disaster response

    forensics

    financial & economic modeling

    ...others

    Submissions:

    E-mail submissions to baw-uai09atintel-research.net, in pdf format.

    Submissions should be in UAI format, limited to 8 pages. Demonstrations to

    accompany talks are encouraged. As in past years, proceedings

    will be posted online.

    Workshop format:

    The format of the workshop will be a series of selected talks, and

    posters, grouped to encourage discussion. We will leave time during breaks

    for poster presentations. Speakers may also want to present posters of

    their work in the poster session.

    Workshop discussions tend to be informal, and the smaller group tends to

    encourage more candid comments from presenters. We ask presenters to consider

    why some projects succeed or fail in a larger organizational context, and

    generally encourage them to take a multi-disciplinary approach. Hopefully this

    will reveal lessons learned from projects that have shown value (or in some

    cases, surprisingly failed to show value) in situations and organizations

    motivated by specific needs.

    Organizers:

    John Mark Agosta, Intel Corp., Santa Clara, CA

    Russell Almond, ETS, Princeton, NJ

    Dennis Buede, Innovative Decisions, Vienna, VA

    Marek J. Druzdzel, ISL, University of Pittsburgh, Pittsburgh, PA

    Judy Goldsmith, University of Kentucky, Lexington, KY

    Silja Renooij, Universiteit Utrecht, The Netherlands


    Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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