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MSST 2012 - 28th IEEE Conference on Mass Storage Systems and Technologies

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Category MSST 2012

Deadline: January 27, 2012 | Date: April 19, 2012-April 20, 2012

Venue/Country: Monterey, U.S.A

Updated: 2011-12-07 19:22:56 (GMT+9)

Call For Papers - CFP

28th IEEE Conference on Mass Storage Systems and Technologies â?“ MSST Research Track

April 19-20, 2012


The 28th IEEE Conference on Mass Storage Systems and Technologies (MSST2012) will be held at

Asilomar Conference Center in Monterey, California from April 16-20, 2012 and offers one week dedicated to storage technology. This yearâ?™s conference will include a two-day research track from April 19-20 of peer-reviewed papers on the design, implementation, and analysis of storage systems. As with prior MSST conferences, this conference will be a top-quality venue for presenting the latest research and development in storage systems and meeting with colleagues from industry, academia, and government.

We encourage the submission of research papers on the implementation, design, and analysis of file and storage systems. Specific areas of interest for MSST2012 include, but are not limited to:

- Performance modeling, benchmarking, and analysis of storage systems

- Parallel and distributed file and storage systems

- Evaluation of networked storage architectures

- Data protection and recovery

- Storage security, privacy, and provenance

- Data archiving, long-term data preservation and management

- Non-volatile memory (SSD) file and storage systems

- Storage in virtualized environments

- Metadata management

- Cloud storage and globally scalable storage approaches

- Caching and replication

- Storage for mobile devices

- Energy-efficient storage systems

- Storage technologies

- Storage system architecture and design

- Experience with real systems

Full paper submissions may be up to 12 pages long, including figures and references. MSST 2012 will also accept short papers up to 5 pages long, including figures and references. Full paper submissions that are not accepted as full papers will also be considered for the short paper session unless the authors request otherwise. All submitted papers (full and short) should be formatted as two-column, letter-size paper (8.5x11) with one inch margins and 10 point font. Reviewing will be single-blind: papers may include author information, and need not be anonymized. Paper abstracts are due one week before the paper submission deadline.

Important Dates

Abstract registration: January 20th, 2012

Paper submissions due: January 27th, 2012

Notification: February 29, 2012

Camera-ready papers due: March 16, 2012

Conference Organizers

Steering Committee

Ben Kobler, NASA/GSFC

Ethan L. Miller, Univ. of California, Santa Cruz

Andre Brinkmann, Univ. of Mainz

Merritt Jones, MITRE Consultant

Sam Coleman, Lawrence Livermore Lab (retired)

Program Co-Chairs

John Bent, EMC

Ethan L. Miller, University of California, Santa Cruz

Program Committee

Ahmed Amer, Santa Clara University

Andre Brinkmann, University of Mainz

Randal Burns, Johns Hopkins University

Phil Carns, Argonne National Laboratory

Toni Cortes, Barcelona Supercomputing Center

Matthew Curry, Sandia National Laboratories

Peter Desnoyers, Northeastern University

Michael Factor, IBM Research Haifa

Evan Felix, Pacific Northwest National Laboratory

Dan Feng, Huazhong University of Science & Technology

Haryadi Gunawi, University of California, Berkeley

Kevin Greenan, EMC

Hong Jiang, University of Nebraska

Ron Oldfield, Sandia National Laboratories

Chanik Park, Samsung

Vijayan Prabhakaran, Microsoft Research

Philip Roth, Oak Ridge National Laboratory

Raju Rangaswami, Florida International University

Jamie Shiers, CERN

Douglas Thain, University of Notre Dame

Andy Wang, Florida State University

Brent Welch, Panasas

Youjip Won, Hanyang University

Tao Xie, San Diego State University

Qing Yang, University of Rhode Island

Yifeng Zhu, University of Maine

Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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