MSST 2012 - 28th IEEE Conference on Mass Storage Systems and Technologies
Website storageconference.org |
Category msst 2012;
Deadline: January 27, 2012 | Date: April 19, 2012-April 20, 2012
Venue/Country: Monterey, U.S.A
Updated: 2011-12-07 19:22:56 (GMT+9)
Call For Papers - CFP28th IEEE Conference on Mass Storage Systems and Technologies â?“ MSST Research Track April 19-20, 2012 http://storageconference.org/ Objectives The 28th IEEE Conference on Mass Storage Systems and Technologies (MSST2012) will be held at Asilomar Conference Center in Monterey, California from April 16-20, 2012 and offers one week dedicated to storage technology. This yearâ?™s conference will include a two-day research track from April 19-20 of peer-reviewed papers on the design, implementation, and analysis of storage systems. As with prior MSST conferences, this conference will be a top-quality venue for presenting the latest research and development in storage systems and meeting with colleagues from industry, academia, and government. We encourage the submission of research papers on the implementation, design, and analysis of file and storage systems. Specific areas of interest for MSST2012 include, but are not limited to: - Performance modeling, benchmarking, and analysis of storage systems - Parallel and distributed file and storage systems - Evaluation of networked storage architectures - Data protection and recovery - Storage security, privacy, and provenance - Data archiving, long-term data preservation and management - Non-volatile memory (SSD) file and storage systems - Storage in virtualized environments - Metadata management - Cloud storage and globally scalable storage approaches - Caching and replication - Storage for mobile devices - Energy-efficient storage systems - Storage technologies - Storage system architecture and design - Experience with real systems Full paper submissions may be up to 12 pages long, including figures and references. MSST 2012 will also accept short papers up to 5 pages long, including figures and references. Full paper submissions that are not accepted as full papers will also be considered for the short paper session unless the authors request otherwise. All submitted papers (full and short) should be formatted as two-column, letter-size paper (8.5x11) with one inch margins and 10 point font. Reviewing will be single-blind: papers may include author information, and need not be anonymized. Paper abstracts are due one week before the paper submission deadline. Important Dates Abstract registration: January 20th, 2012 Paper submissions due: January 27th, 2012 Notification: February 29, 2012 Camera-ready papers due: March 16, 2012 Conference Organizers Steering Committee Ben Kobler, NASA/GSFC Ethan L. Miller, Univ. of California, Santa Cruz Andre Brinkmann, Univ. of Mainz Merritt Jones, MITRE Consultant Sam Coleman, Lawrence Livermore Lab (retired) Program Co-Chairs John Bent, EMC Ethan L. Miller, University of California, Santa Cruz Program Committee Ahmed Amer, Santa Clara University Andre Brinkmann, University of Mainz Randal Burns, Johns Hopkins University Phil Carns, Argonne National Laboratory Toni Cortes, Barcelona Supercomputing Center Matthew Curry, Sandia National Laboratories Peter Desnoyers, Northeastern University Michael Factor, IBM Research Haifa Evan Felix, Pacific Northwest National Laboratory Dan Feng, Huazhong University of Science & Technology Haryadi Gunawi, University of California, Berkeley Kevin Greenan, EMC Hong Jiang, University of Nebraska Ron Oldfield, Sandia National Laboratories Chanik Park, Samsung Vijayan Prabhakaran, Microsoft Research Philip Roth, Oak Ridge National Laboratory Raju Rangaswami, Florida International University Jamie Shiers, CERN Douglas Thain, University of Notre Dame Andy Wang, Florida State University Brent Welch, Panasas Youjip Won, Hanyang University Tao Xie, San Diego State University Qing Yang, University of Rhode Island Yifeng Zhu, University of Maine
Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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