VALID 2010 - The Second International Conference on Advances in System Testing and Validation Lifecycle

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Category VALID 2010

Deadline: March 20, 2010 | Date: August 22, 2010

Venue/Country: Nice, France

Updated: 2010-06-04 19:32:22 (GMT+9)

Call For Papers - CFP

The conference on advances in system testing and validation considers the concepts, methodologies, and solutions dealing with designing robust and available systems. Its target covers aspects related to debugging and defects, vulnerability discovery, diagnosis, and testing.

The inaugural conference VALID 2010 continues a series of events focusing on designing robust components and systems with testability for varia features of behavior and interconnection. The conference will provide a forum where researchers shall be able to present recent research results and new research problems and directions related to them. The conference seeks contributions presenting novel result and future research in all aspects of robust design methodologies, vulnerability discovery and resolution, diagnosis, debugging, and testing.

The topics suggested by the conference can be discussed in term of concepts, state of the art, research, standards, implementations, running experiments, applications, and industrial case studies. Authors are invited to submit complete unpublished papers, which are not under review in any other conference or journal in the following, but not limited to, topic areas. All tracks are open to both research and industry contributions.

Robust design methodologies

Designing methodologies for robust systems

Secure software techniques

Industrial real-time software

Defect avoidance

Cost models for robust systems

Design for testability

Design for reliability and variability

Design for adaptation and resilience

Design for fault-tolerance and fast recovery

Design for manufacturability, yield and reliability

Design for testability in the context of model-driven engineering

Vulnerability discovery and resolution

Vulnerability assessment

On-line error detection

Vulnerabilities in hardware security

Self-calibration

Alternative inspections

Non-intrusive vulnerability discovery methods

Embedded malware detection

Defects and Debugging

Debugging techniques

Component debug

System debug

Software debug

Hardware debug

System debug

Power-ground defects

Full-open defects in interconnecting lines

Physical defects in memories and microprocessors

Zero-defect principles

Diagnosis

Diagnosis techniques

Advances in silicon debug and diagnosis

Error diagnosis

History-based diagnosis

Multiple-defect diagnosis

Optical diagnostics

Testability and diagnosability

Diagnosis and testing in mo bile environments

System and feature testing

Test strategy for systems-in-package

Testing embedded systems

Testing high-speed systems

Testing delay and performance

Testing communication traffic and QoS/SLA metrics

Testing robustness

Software testing

Hardware testing

Supply-chain testing

Memory testing

Microprocessor testing

Mixed-signal production test

Testing multi-voltage domains

Interconnection and compatibility testing

Testing techniques and mechanisms

Fundamentals for digital and analog testing

Emerging testing methodologies

Engineering test coverage

Designing testing suites

Statistical testing

Functional testing

Parametric testing

Defect- and data-driven testing

Automated testing

Embedded testing

Autonomous self-testing

Low cost testing

Optimized testing

Testing systems and devices

Test standards

Testing of wireless communications systems

Testing of mobile wireless communication systems

Testing of wireless sensor networks

Testing of radio-frequency identification systems

Testing of ad-hoc networks

Testing methods for emerging standards

Hardware-based prototyping of wireless communication systems

Physical layer performance verification

On-chip testing of wireless communication systems

Modeling and simulation of wireless channels

Noise characterization and validation

Case studies and industrial applications of test instruments

Software verification and validation

High-speed interface verification and fault-analysis

Software testing theory and practice

Model-based testing

Verification metrics

Service/application specific testing

Model checking

OO software testing

Testing embedded software

Quality assurance

Empirical studies for verification and validation

Software inspection techniques

Software testing tools

New approaches for software reliability verification and validation

Testing and validation of run-time evolving systems

Automated testing for run-time evolving systems

Testing and validation of evolving systems

Testing and validation of self-controlled systems

Testing compile-time versus run-time dependency for evolving systems

On-line validation and testing of evolving at run-time systems

Modeling for testability of evolving at run-time systems

Near real-time and real-time monitoring of run-time evolving systems

Verification and validation of reflective models for testing

Verification and validation of fault tolerance in run-time evolving systems

Feature-oriented testing

Testing user interfaces and user-driven features

Privacy testing

Ontology accuracy testing

Testing semantic matching

Testing certification processes

Testing authentication mechanisms

Testing biometrics methodologies and mechanisms

Testing cross-nation systems

Testing system interoperability

Testing system safety

Testing system robustness

Testing temporal constraints

Testing transaction-based properties

Directed energy test capabilities /microwave, laser, etc./

Testing delay and latency metrics;

Domain-oriented testing

Testing autonomic and autonomous systems

Testing intrusion prevention systems

Firewall testing

Information assurance testing

Testing social network systems

Testing recommender systems

Testing biometric systems

Testing diagnostic systems

Testing on-line systems

Testing financial systems

Testing life threatening systems

Testing emergency systems

Testing satellite and wireless systems

Testing mobile environments

Testing RFID systems

Testing sensor-based systems

Testing testing systems;

INSTRUCTION FOR THE AUTHORS

Authors of selected papers will be invited to submit extended versions to one of the IARIA Journals.

Important deadlines:

Submission (full paper) March 20, 2010

Notification April 25, 2010

Registration May 15, 2010

Camera ready May 22, 2010

Only .pdf or .doc files will be accepted for paper submission. All received papers will be acknowledged via an automated system.

Final author manuscripts will be 8.5" x 11", not exceeding 6 pages; max 4 extra pages allowed at additional cost. The formatting instructions can be found on the Instructions page. Helpful information for paper formatting can be found on the here.

Your paper should also comply with the additional editorial rules.

Once you receive the notification of paper acceptance, you will be provided by the publisher an online author kit with all the steps an author needs to follow to submit the final version. The author kits URL will be included in the letter of acceptance.

Poster Forum

Posters are welcome. Please submit the contributions following the instructions for the regular submissions using the "Submit a Paper" button and selecting the contribution type as poster. Submissions are expected to be 6-8 slide deck. Posters will not be published in the Proceedings. One poster with all the slides together should be used for discussions. Presenters will be allocated a space where they can display the slides and discuss in an informal manner. The poster slide decks will be posted on the IARIA site.

For more details, see the Poster Forum explanation page.

Work in Progress

Work-in-progress contributions are welcome. Please submit the contributions following the instructions for the regular submissions using the "Submit a Paper" button and selecting the contribution type as work in progress. Authors should submit a four-page (maximum) text manuscript in IEEE double-column format including the authors' names, affiliations, email contacts. Contributors must follow the conference deadlines, describing early research and novel skeleton ideas in the areas of the conference topics. The work will be published in the conference proceedings.

For more details, see the Work in Progress explanation page

Technical marketing/business/positioning presentations

The conference initiates a series of business, technical marketing, and positioning presentations on the same topics. Speakers must submit a 10-12 slide deck presentations with substantial notes accompanying the slides, in the .ppt format (.pdf-ed). The slide deck will not be published in the conference’s CD Proceedings. Presentations' slide decks will be posted on the IARIA's site. Please send your presentations to petreiaria.org.

Tutorials

Tutorials provide overviews of current high interest topics. Proposals should be for three hour tutorials. Proposals must contain the title, the summary of the content, and the biography of the presenter(s). The tutorials' slide decks will be posted on the IARIA's site. Please send your proposals to petreiaria.org

Panel proposals:

The organizers encourage scientists and industry leaders to organize dedicated panels dealing with controversial and challenging topics and paradigms. Panel moderators are asked to identify their guests and manage that their appropriate talk supports timely reach our deadlines. Moderators must specifically submit an official proposal, indicating their background, panelist names, their affiliation, the topic of the panel, as well as short biographies. The panel's slide deck will be posted on the IARIA's site.

For more information, petreiaria.org

Workshop proposals

We welcome workshop proposals on issues complementary to the topics of this conference. Your requests should be forwarded to petreiaria.org.