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    I2MTC 2011 - 2011 Ieee International Instrumentation And Measurement Technology Conference IMTC 2011

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    Website imtc.ieee-ims.org/imtc/2011 | Want to Edit it Edit Freely

    Category Instrumentation ; Measurement

    Deadline: November 15, 2010 | Date: May 10, 2011-May 12, 2011

    Venue/Country: Hangzhou, China

    Updated: 2010-10-26 11:16:12 (GMT+9)

    Call For Papers - CFP

    The Conference focuses on all aspects of instrumentation and measurement science and technology?

    research, development and applications. The program topics include but are not limited to:

    FUNDAMENTALS

    Theoretical foundations

    Quantities, units & standards

    Calibration & self-calibration

    Measurement uncertainty

    Methodology of teaching

    Modeling of signals and systems

    SENSORS AND TRANSDUCERS

    Smart sensors and sensor networks

    Optical, chemical and biological sensors

    Wireless sensors

    Sensor arrays

    Energy harvesting

    Sensor standards

    Sensor applications

    MEASUREMENTS OF

    PHYSICAL QUANTITIES

    Electrical & power measurements

    Dielectric & magnetic measurements

    Temperature, moisture & humidity

    measurements

    Mechanical measurements

    Optical measurements

    Chemical & biological measurements

    MEASUREMENT-DATA &

    SIGNAL PROCESSING

    A/D and D/A converters

    Analog and mixed signal processing

    Data preprocessing & postprocessing

    Digital signal processing

    Digital image processing

    Pattern recognition

    Inverse problems & signal reconstruction

    Signal detection & classification

    Sensor array processing

    Data mining and fusion

    MEASUREMENT SYSTEMS

    Fault-tolerant & resilient measurement

    systems

    Integrated & visual measurement

    systems

    Distributed measurement systems

    Autonomous measurement systems

    Non-invasive measurement systems

    Virtual measurement systems

    Measurement microsystems

    Human-computer interface

    Automated test & diagnostics systems

    MEASUREMENT APPLICATIONS

    Health care

    Food safety and security

    Quality assurance and authentication

    Renewable energy systems

    Carbon capture and storage

    Plant optimization

    Environmental monitoring

    Intelligent buildings

    Multiphase flow measurement

    Soft sensing and soft computing

    Robotics and industrial monitoring

    Automotive & transportation

    Avionics and aerospace

    Ships and marine technology

    Medicine and scientific research

    Security and biometrics

    Telecommunications

    Remote sensing

    Potential authors are invited to submit extended abstracts via the I?MTC website (http://imtc.ieee-ims.org/).

    Each extended abstract (3 or 4 pages in English) should report results of the original research of

    theoretical or applied nature. The extended abstract should, moreover, explain the significance of the

    contribution and contain a list of key references. It must be prepared according to the abstract preparation

    guidelines provided on the I?MTC website. A Student Paper Contest will be held for both graduate and

    undergraduate student papers, with cash awards for the best papers and travel subsidies ranging from

    USD 300 to USD 1000 depending on student location. Extended abstracts should be submitted by the

    students according to the rules posted on the website and should be identified as student papers. Check

    that website for detailed instructions and deadlines:

    ? October 25, 2010 ? Deadline for submission of extended abstracts.

    ? December 20, 2010 ? Notification of authors of acceptance or rejection decisions.

    ? March 1, 2011 ? Deadline for the submission of camera-ready full-text papers.

    The extended abstracts will be reviewed by the Technical Program Committee. The authors of accepted

    papers must register for the Conference and attend to present their papers. The authors of papers,

    presented during I?MTC 2011, will be allowed to submit expanded and extended versions of their papers

    to the Special Issue of IEEE Transactions on Instrumentation & Measurement on I?MTC 2011 to be

    published in 2012.


    Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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