Sign for Notice Everyday    Sign Up| Sign In| Link| English|

Our Sponsors

    Receive Latest News

    Feedburner
    Share Us


    O¦ÌS¡¯09 2009 - 3rd EOS Topical Meeting on Optical Microsystems (O¦ÌS¡¯09)

    View: 1883

    Website http://www.myeos.org/capri_oms09 | Want to Edit it Edit Freely

    Category O¦ÌS¡¯09 2009

    Deadline: April 30, 2009 | Date: September 27, 2009

    Venue/Country: Capri, Italy

    Updated: 2010-06-04 19:32:22 (GMT+9)

    Call For Papers - CFP

    Synopsis

    This meeting is the 3rd of the EOS Topical Meeting Series on Optical Microsystems. Former meetings took place in Capri in 2005 and 2007. The event is organized in collaboration with the Italian Society of Optics and Photonics (SIOF), the Italian branch of EOS.

    top

    TOPICS

    Plasmonics Photonic crystals and metamaterials

    Materials, fabrication techniques, characterisation

    Numerical methods

    Passiveand active devices

    Nonlinear response

    Optical microsystems and microsensors

    MEMS, MOEMS, NEMS

    New materials and technologies

    New active and passive devices in optoelectronics

    Silicon based microsystems

    Electro-optic materials

    Polymer-based devices

    Liquid crystal- and organic material-based devices

    Biophotonics and biochips

    Smart sensors and transducers

    Physical and chemical sensors

    Biosensors

    Sensing and actuation

    Fibre-optic sensors

    Optofluidic microsystems and devices

    Nanomaterials and devices

    Bio-optofluidics

    Imaging, sorting, circuits

    Adaptive interconnections and devices

    Multifunctional devices

    Nonlinear optic devices

    Materials and phenomena

    Periodically-poled devices

    Micro-nano engineering of ferroelectric materials

    Solitons, soliton waveguides and 3-D circuits

    Adaptive interconnections and devices

    Multifunctional devices

    New characterisation methods for materials and devices

    Interferometric techniques for imaging and testing

    Scanning probe/optical microscopy, SNOM

    High-super resolution methods in optical microscopy

    Application of optical systems in:

    Information society technology

    Automotive, avionics and aerospace

    Environment, geophysics and microgravity

    Genomics and proteomics

    Health, food and agriculture

    Homeland security

    Material processing

    Cultural heritage


    Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
    Disclaimer: ourGlocal is an open academical resource system, which anyone can edit or update. Usually, journal information updated by us, journal managers or others. So the information is old or wrong now. Specially, impact factor is changing every year. Even it was correct when updated, it may have been changed now. So please go to Thomson Reuters to confirm latest value about Journal impact factor.