Validation Sampling Plans for Process Validation [Latest]
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Website https://www.compliance4all.com/control/w_product/~product_id=502180LIVE?channel=ourglocal_Nov_2018_S |
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Category Statistical Methods, Medical Devices, Sampling Plans 2018, importance of statistics, statistics example, scope of statistics, Warning letters, Process Engineers and Management, Destruction Test Methods
Deadline: November 04, 2018 | Date: November 05, 2018
Venue/Country: Online, U.S.A
Updated: 2018-09-07 15:27:19 (GMT+9)
Call For Papers - CFP
Overview:Select from among these sampling plans that plan which offers the best balance between the number of units tested and the risk of failing the validationHow to identify when sampling plans for other properties are required for things like precision, accuracy, homogeneity and failure ratesWhy should you Attend:In the medical device industry acceptance sampling plans are required for Validation/Verification/Effectiveness studies that must:Be based on a written procedureAligns the plans to riskProvides a valid statistical rationaleAreas Covered in the Session:Claims that can be made when passing a sampling planHow to select a sampling plan to make a specific claimDifferent types of sampling plans including single, double and variablesHow to reduce the number of units testedWho Will Benefit:Process Engineers and ManagementDesign Engineer and ManagementRegulatory and CAPA PersonnelStatisticiansSpeaker Profile:Wayne Taylor is a leading expert on the application of Statistics to the Medical Device and other FDA regulated industries. His new book Statistical Procedure for the Medical Device Industry sets the standard for applying statistics in compliance with Section ยง820.250, Statistical Techniques of the Code of Federal Regulations.Event Fee: One Dial-in One Attendee Price: US $150.00Contact Detail:Compliance4All DBA NetZealous,Phone: +1-800-447-9407Email: supportcompliance4All.com
Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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