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Website https://ais.cn/u/VFbeMj |
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Category Machine Vision;Automatic Identification;Biometrics;Image Processing;Artificial Intelligence
Deadline: April 17, 2026 | Date: April 24, 2026-April 26, 2026
Venue/Country: Wuhan, China
Updated: 2026-02-05 15:32:47 (GMT+9)
---Call for papers---The topics of interest include, but are not limited to:(1)Machine Vision- Optical imaging- Image capture- Light source system- Digital Image Processing- Sensor- Active Vision- 3D-Vision- Artificial Intelligence- Image Processing- Image Processing Methods- Computational Imaging- Machine Vision Systems and Component(2)Automatic Identification and Detection Technology- Artificial Intelligence Techniques in Automatic Identification- Biometrics (including face recognition)- Document Processing and Recognition- Advanced Learning Methods- Linear Models and Dimensionality Reduction- Natural Language Processing and Recognition- Face and gesture recognition- Pattern recognition- Image Forensics and Identification- Microcomputer Measurement and Control Device and System- Sensor Technique & Application- Automatic Detection and Conversion Technology- Research and Application of Detection Technology and Automation Device- Control, Operation and Maintenance of Automatic Detection System---Publication---All full paper submissions to the MVAID 2026 will be sent to at least two reviewers and evaluated based on originality, technical or research content or depth, correctness, relevance to conference, contributions, and readability. All accepted and registered papers will be published by Conference Proceedings, which will be submitted to EI Compendex, Scopus for indexing.---Important Dates---Submission Date: February 27, 2026Registration Deadline: March 23, 2026Final Paper Submission Date: April 20, 2026Conference Dates: April 24-26, 2026 --- Paper Submission--- Please send the full paper(word+pdf) to Submission System: https://ais.cn/u/VFbeMj
Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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