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    DATE 2012 - 15th DATE conference and exhibition on Design, Automation and Test in Europe

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    Category DATE 2012

    Deadline: September 11, 2011 | Date: March 12, 2012-March 16, 2012

    Venue/Country: Dresden, Germany

    Updated: 2011-04-16 14:58:30 (GMT+9)

    Call For Papers - CFP

    The 15th DATE conference and exhibition is the main European event bringing together designers and design automation users, researchers

    and vendors, as well as specialists in the hardware and software design, test and manufacturing of electronic circuits and systems. It put strong emphasis on both ICs/SoCs, reconfigurable hardware and embedded systems, including embedded software.

    Structure of the Event

    The five-day event consists of a conference with plenary invited papers, regular papers, panels, hot-topic sessions, tutorials, workshops, two

    special focus days and a track for executives. The scientific conference is complemented by a commercial exhibition showing the state-ofthe-art in design and test tools, methodologies, IP and design services, reconfigurable and other hardware platforms, embedded software, and

    (industrial) design experiences from different application domains, such as automotive, wireless, telecom and multimedia applications. The

    organisation of user group meetings, fringe meetings, a university booth, a PhD forum, vendor presentations and social events offers a wide

    variety of extra opportunities to meet and exchange information on relevant issues for the design and test community. Special space will also

    be allocated for EU-funded projects to show their results. More details are given on the DATE website (www.date-conference.com).

    Areas of Interest

    Within the scope of the conference, the main areas of interest are: embedded systems, design methodologies, CAD languages, algorithms and

    tools, testing of electronic circuits and systems, embedded software, applications design and industrial design experiences. Topics of interest

    include, but are not restricted to:

    System Specification and Modeling

    System Design, Synthesis and Optimization

    Simulation and Validation

    Design of Low Power Systems

    Power Estimation and Optimization

    Emerging Technologies, Systems and Applications

    Formal Methods and Verification

    Network on Chip

    Architectural and Microarchitectural Design

    Architectural and High-Level Synthesis

    Reconfigurable Computing

    Logic and Technology Dependent Synthesis for

    Deep-Submicron Circuits

    Physical Design and Verification

    Analogue and Mixed-Signal Circuits and Systems

    Interconnect, EMC, EMD and Packaging Modeling

    Computing Systems

    Communication, Consumer and Multimedia Systems

    Transportation Systems

    Medical and Healthcare Systems

    Energy Generation, Recovery and Management Systems

    Secure, Dependable and Adaptive Systems

    Test for Defects, Variability, and Reliability

    Test Generation, Simulation and Diagnosis

    Test for Mixed-Signal, Analog, RF, MEMS

    Test Access, Design-for-Test, Test Compression, System Test

    On-Line Testing and Fault Tolerance

    Real-time, Networked and Dependable Systems

    Compilers and Code Generation for Embedded Systems;

    Software-centric System Design Exploration

    Model-based Design and Verification for Embedded Systems

    Embedded Software Architectures and Principles; Software for

    MPSoC, Multi/many-core and GPU-based Systems "

    Submission of Papers

    All papers have to be submitted electronically by September 11, 2011 via:

    http://www.date-conference.com/submit.html

    Papers can be submitted either for standard oral presentation or for interactive presentation.

    Event Secretariat

    European Conferences

    3 Coates Place, Edinburgh, EH3 7AA, UK

    Tel: +44-131-225-2892 Fax: +44-131-225-2925

    Email: sue.menziesatec.u-net.com

    http://www.date-conference.com


    Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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