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Category RASDAT 2012
Deadline: September 26, 2011 | Date: January 07, 2012-January 08, 2012
Venue/Country: Hyderabad, India
Updated: 2011-05-02 10:47:38 (GMT+9)
Representative topics include, but are not limited to:-Design for test,- Built-in self-test- ATPG and defect oriented test- Delay test- Low power test- Instruction-based self-test- On-line test methodology- Reliability of CMOS circuits- Self checker circuits- Self diagnosis methods- Fault tolerant micro-architecture- Self-healing system design- Energy and performance aware fault tolerant micro-architectures- Device degradation and mitigation- System validation methodology- Secure system design- Design for reliability, dependability, and verifiabilitySubmissionsAuthors are invited to submit previously unpublished technical proposals. The proposals must be full papers not to exceed 6 pages. Each submission should include: title, full name and affiliation of all authors, a short abstract of 50 words, and 4 to 6 keywords. Also, identify a contact author and include a complete correspondence address, phone number, fax number, and e-mail address. Submit a copy of your proposal in PDF either online submission or via e-mail to : rasdat2012
serc.iisc.ernet.inKey Dates:Paper Submission: September 26, 2011Acceptance Notification: October 31, 2011Final Paper Due: December 1, 2011Presentation Due: Jan 1, 2012General InformationAdit SinghAuburn University, Auburn, USAE-mail: adsingh
auburn.eduTel: +1.334.644.1647Fax: +1.334.844.1809Virendra SinghIndian Institute of Science, Bangalore, IndiaE-mail: viren
serc.iisc.ernet.inVirendra
computer.orgTel: +91.80.2293.3421Fax: +91.80.2360.2648Program Related InformationErik LarssonLinkoping University, SwedenE-mail: erila
ida.liu.eduTel: +46.13.28.6619Fax: +46.13.28.4499Rubin ParekhjiTexas Instruments, Bangalore, IndiaE-mail: parekhji
ti.comKeywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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