Sign for Notice Everyday    注册| 登陆| 友情链接| English|

Our Sponsors


    RASDAT 2012 - 3rd IEEE International Workshop on Reliability Aware System Design and Test (RASDAT12)

    View: 2232

    Website | Want to Edit it Edit Freely

    Category RASDAT 2012

    Deadline: September 26, 2011 | Date: January 07, 2012-January 08, 2012

    Venue/Country: Hyderabad, India

    Updated: 2011-05-02 10:47:38 (GMT+9)

    Call For Papers - CFP

    Even as advances in CMOS technology come up against physical limits of material properties and lithography, raising many new challenges that must be overcome to ensure IC quality and reliability, there appears to be no obvious alternate technology that can replace End-of-Roadmap CMOS over the next decade. However, many reliability challenges from increasing defect rates, manufacturing variations, soft errors, wearout, etc. will need to be addressed by innovative new design and test methodologies if device scaling is to continue on track as per Moore`s Law to 10nm and beyond. The key objective of this annual workshop, planned to be held in conjunction with the International Conference on VLSI Design, is to provide an informal forum for vigorous creative discussion and debate of this area. The aim is to encourage the presentation and discussion of truly innovative and `out-of-the-box` ideas that may not yet have been fully developed for presentation at reviewed conferences to address these challenges. Additionally, the workshop invites embedded talks and tutorials on cutting edge topics related to reliability aware design of CMOS and hybrid nanotechnology systems.

    http://www.serc.iisc.ernet.in/~viren/RASDAT12/

    Representative topics include, but are not limited to:

    -Design for test,

    - Built-in self-test

    - ATPG and defect oriented test

    - Delay test

    - Low power test

    - Instruction-based self-test

    - On-line test methodology

    - Reliability of CMOS circuits

    - Self checker circuits

    - Self diagnosis methods

    - Fault tolerant micro-architecture

    - Self-healing system design

    - Energy and performance aware fault tolerant micro-architectures

    - Device degradation and mitigation

    - System validation methodology

    - Secure system design

    - Design for reliability, dependability, and verifiability

    Submissions

    Authors are invited to submit previously unpublished technical proposals. The proposals must be full papers not to exceed 6 pages. Each submission should include: title, full name and affiliation of all authors, a short abstract of 50 words, and 4 to 6 keywords. Also, identify a contact author and include a complete correspondence address, phone number, fax number, and e-mail address. Submit a copy of your proposal in PDF either online submission or via e-mail to : rasdat2012atserc.iisc.ernet.in

    Key Dates:

    Paper Submission: September 26, 2011

    Acceptance Notification: October 31, 2011

    Final Paper Due: December 1, 2011

    Presentation Due: Jan 1, 2012

    General Information

    Adit Singh

    Auburn University, Auburn, USA

    E-mail: adsinghatauburn.edu

    Tel: +1.334.644.1647

    Fax: +1.334.844.1809

    Virendra Singh

    Indian Institute of Science, Bangalore, India

    E-mail: virenatserc.iisc.ernet.in

    Virendraatcomputer.org

    Tel: +91.80.2293.3421

    Fax: +91.80.2360.2648

    Program Related Information

    Erik Larsson

    Linkoping University, Sweden

    E-mail: erilaatida.liu.edu

    Tel: +46.13.28.6619

    Fax: +46.13.28.4499

    Rubin Parekhji

    Texas Instruments, Bangalore, India

    E-mail: parekhjiatti.com


    Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
    Disclaimer: ourGlocal is an open academical resource system, which anyone can edit or update. Usually, journal information updated by us, journal managers or others. So the information is old or wrong now. Specially, impact factor is changing every year. Even it was correct when updated, it may have been changed now. So please go to Thomson Reuters to confirm latest value about Journal impact factor.