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    IMS3TW 2011 - 2011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW 2011)

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    Category IMS3TW 2011

    Deadline: February 21, 2011 | Date: May 16, 2011-May 18, 2011

    Venue/Country: Santa Barbara, U.S.A

    Updated: 2011-05-03 23:47:41 (GMT+9)

    Call For Papers - CFP

    IMS3TW’11 will continue to address the traditional technology spectrum of analog, mixed-signal, and RF testing, but with increased attention to all aspects of current design complexity (e.g., parametric variability, power consumption, temperature effects). In this year’s program, a keynote speech, two special sessions, and a penal have been organized: (Preliminary Technical Program is now available !!!!)

    https://sites.google.com/site/ims3tw2011/

    Keynote speaker: Dr. Naresh R. Shanbhag, UIUC

    "System-assisted mixed-signal design"

    Special Session: Current Industrial Practices for Analog/Mixed-Signal/RF IC Test

    Organizer: TM Mak, Intel, USA

    ? Elida de-Obaldia, Texas Instruments, USA

    ? Bryan Casper, Intel, USA

    ? Michael Laisne, Qualcomm, USA

    Special Session: Lab-on-Chip Test Issues

    Organizer: A. Simonian, Auburn University, NSF Bio-sensors Program Director, USA

    ? Holger Schmidt, University of California, Santa Cruz, USA

    ? Ali Adibi, Georgia Tech, USA

    ? M.A. Miled and M. Sawan, École Polytechnique de Montréal, Canada

    Panel: "Are sensors and mixed-signal ICs a threat to safety in cars"

    Moderator: Hans Kerkhoff, Univ. of Twente ? The Netherlands

    Organizer: Krishnendu Chakrabarty, Duke Univ. ? USA

    Social Program: Santa Barbara is known for its world-class wine and vineyards. In this year’s social program, we will visit two local wineries in the Santa Ynez Valley.

    Prospective authors are invited to submit papers on the topics of interest. Submissions should be via the workshop web-site and consist of either an extended summary of at least 750 words or a full paper. The accepted papers will be published by Conference Publishing Services (CPS) in proceedings available on the IEEE digital library (EXPLORE). Selected papers from the workshop will be invited for submission to a special issue of Journal of Electronic Testing (JETTA).

    Primary Topics of Interest include:

    Test & Design for (on/off-line) Test

    Verification & Design for Verification

    Reliability & Design for Reliability

    Post-Silicon Validation

    Fault/Error Modelling & Simulation

    Diagnosis & Design for Debug/Diagnosis

    Fault Tolerance

    Pertaining to the following systems or underlying technologies:

    Analog/Mixed-Signal Circuits

    Biomedical Circuits & Systems

    Lab-on-Chip

    MEMS

    RF & Wirelessly Controlled Devices

    Microfluidics

    Optoelectronics & Photonics

    Heterogeneous Systems

    Drug Delivery Microsystems

    Implantable Devices

    Embedded Systems

    Important Dates

    Submission deadline: February 21, 2011 (extended)

    Notification of acceptance: March 21, 2011

    Camera-ready full papers: April 21, 2011

    Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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