WNM 2009 - WNM 2009: The 4th IEEE LCN Workshop on Network Measurements
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Website http://www.ieeelcn.org |
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Category WNM 2009
Deadline: May 12, 2009 | Date: October 20, 2009
Venue/Country: ZÃ?rich, Switzerland
Updated: 2010-06-04 19:32:22 (GMT+9)
Call For Papers - CFP
WNM 2009: The 4th IEEE LCN Workshop on Network MeasurementsTo be held in conjunction with34th IEEE Conference on Local Computer Networks (LCN 2009)October 20-23, 2009Swiss?tel Z?richSchulstrasse 44, CH-8050 Z?rich, Switzerland <http://www.ieeelcn.org/lcn34venue.html
>The LCN International Workshop on Network Measurements, will be held in conjunction with the IEEE Conference on Local Computer Networks (LCN) <http://www.ieeelcn.org
> . The workshop will include papers and panels dealing with latest advances and challenges facing the field. The expected audience will include networking researchers, practitioners, scientists and engineers from industry, academia and government. LCN registration will cover workshop attendance.The first three IEEE LCN Workshop on Network Measurements were very successful in bringing together a set of participants actively working on network measurements in various domains. We will continue to address network measurements from different perspectives and different domains.Topics of InterestNetwork measurements are crucial for operation, diagnosis, and characterization of complex networks. Accurate characterization is important for understanding the behavior of networks and for evaluating the scalability, reliability and performance of protocols. Cross-layer designs, and overlay protocols often rely on measurements. Measurements in wired and wireless domains, and end-to-end and subnet measurements face domain specific constraints while sharing common objectives. Complex dynamics of the networks and also the difficulties in performing measurement itself pose many challenges. This workshop will provide a forum for researchers and practitioners interested in network measurements to discuss and exchange measurement related research in both wireless and wired domains, and also explore emerging fields of measurements such as on mobile devices.High quality, previously unpublished work is solicited on the topics including, but not limited to:* Measurements on homogeneous and heterogeneous networks* Physical layer characteristics and measurements for wireless networks* Implementation and operational challenges of wireless testbeds* Mobility models and traffic patterns* Wired and wireless domain measurements* Measurement tools, benchmarks and data sets* Bandwidth, capacity and delay estimation* Active and passive measurements at core nodes* End-to-end and/or application-level measurements over the Internet* Metrics for network characterization* Measurements on Mobile devices* Applications and protocols relying on network measurementsPaper length should not exceed 8 pages. Papers should be submitted electronically in PDF format via EDAS. Papers will go through a thorough review process. The accepted papers will appear in the IEEE LCN conference proceedings and also be available via IEEE Xplore.Proposals for panel sessions are also invited. Please send the proposal by the same deadline as for papers.Important DatesPaper registration deadline: May 12, 2009Paper submission deadline: May 19, 2009Notification of acceptance: June 30, 2009Camera-ready paper due: July 28, 2009Registration deadline: July 28, 2009Information on registration, hotel, etc. is available at IEEE Conference on Local Computer Networks (LCN) <http://www.ieeelcn.org/
>General ChairsNischal M. PiratlaDeutsche Telekom, Inc.,R&D LabLos Altos, USANischal.Piratla
telekom.deAnura P. JayasumanaComputer Networking Research LaboratoryDepartment of Electrical & Computer EngineeringColorado State UniversityFort Collins, CO 80523, USAAnura.Jayasumana
colostate.eduProgram CommitteeTarun BankaCisco Systems, USAFalko DresslerUniversity of Erlangen, GermanyDominique DudkowskiNEC Europe, Ltd., GermanyYing LiuCisco Systems, USADan MasseyColorado State University, USAAngela NicoaraDeutsche Telekom, Inc., R&D Lab, USAJens-Peter RedlichHumboldt University, GermanyQin YangHIT ShenZhen Graduate School, Hong KongDaniel VivancoClearWire, USARick WhitnerAgilent Technologies, USAPetros ZerfosIBM T. J. Watson Research Center, USABeichuan ZhangUniversity of Arizona, USA
Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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