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    ICICTES 2012 - Third International Conference on Information and Communication Technology for Embedded Systems

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    Website http://www.icictes2012.org/ | Want to Edit it Edit Freely

    Category ICICTES 2012

    Deadline: January 23, 2012 | Date: March 22, 2012-March 24, 2012

    Venue/Country: Bangkok, Thailand

    Updated: 2012-01-16 22:42:32 (GMT+9)

    Call For Papers - CFP

    The Third International Conference on Information and Communication

    Technology for Embedded Systems

    VIE Hotel, Bangkok, Thailand 22-24 March 2012

    URL: http://www.icictes2012.org/

    CALL FOR PAPER

    The Third International Conference of Information and Communication

    Technology for Embedded Systems (IC-ICTES 2012) is established to

    provide an international forum for researchers and industry

    practitioners to share their new ideas, original research results and

    practical development experiences from all embedded system-related

    areas including ubiquitous computing, pervasive computing, embedded

    system design, development of new HW/SW-related theories and

    techniques in embedded systems, information and communication

    technology for supporting development of embedded systems, and

    information and communication technology used in embedded systems.

    AREAS OF INTEREST

    The conference calls for research papers reporting original

    investigation results of research and development on real embedded

    system applications and their system development. Topics in IC-ICTES

    2012 are listed below, but not limited to:

    A. Embedded system architecture: Multiprocessors, reconfigurable

    platforms, memory management support, communication, protocols,

    network-on-chip, real-time systems, embedded microcontrollers.

    B. Real-time systems: All real-time related aspects such as software,

    distributed real-time systems, real-time kernels, real-time OS, task

    scheduling, multitasking design.

    C. Embedded hardware support: System-on-a-chip, DSPs, hardware

    specification, synthesis, modeling, simulation and analysis at all

    levels for low power, power-aware, testable, reliable, verifiable

    systems, performance modeling, validation, security issues, real-time

    behavior and safety critical systems.

    D. Embedded software: Compilers, assemblers and cross assemblers,

    programming, memory management, object-oriented aspects, virtual

    machines, scheduling, concurrent software for SoCs,

    distributed/resource aware OS, OS and middleware support.

    E. Hardware/software co-design: Methodologies, test and debug

    strategies, real-time systems, specification and modeling, design

    representation, synthesis, partitioning, estimation, design space

    exploration beyond traditional hardware/software boundary and

    algorithms.

    F. Testing techniques: All aspects of testing, including

    design-for-test, test synthesis, built-in self-test, embedded test,

    for embedded and system-on-a-chip systems.

    G. Application-specific processors and devices: Network processors,

    real-time processor, media and signal processors, application specific

    hardware accelerators, reconfigurable processors, low power embedded

    processors, bio/fluidic processors, Bluetooth, hand-held devices, _ash

    memory chips.

    H. Industrial practices and benchmark suites: System design, processor

    design, software, tools, case studies, trends, emerging technologies,

    experience maintaining benchmark suites, representation, interchange

    format, tools, copyrights, maintenance, metrics.

    I. Embedded computing education: Curriculum issues, teaching tools and

    methods.

    J. Emerging new topics: New challenges for next generation embedded

    computing systems, arising from new technologies (e.g.,

    nanotechnology), new applications (e.g., pervasive or ubiquitous

    computing, embedded internet tools) and new principle (e.g., embedded

    Engineering).

    K. Embedded System Applications: All ranges of applications on

    embedded system, including speech processing, image processing,

    network computing, distributed computing, parallel computing and power

    conversion.

    L. Automotive Engineering: Automotive design, new challenges

    on development of autoparts and automatives, safety engineering, fuel

    economy/emissions, vehicle dynamics, NVH engineering, automotive

    performance, shift quality, durability/corrosion engineering,

    package/ergonomics engineering, climate control, derivability, program

    timing, assembly feasibility, automotive embedded systems.

    IMPORTANT DATES

    Submission deadline: 23 January 2012

    Notification of acceptance: 6 February 2012

    Camera-ready submission 20 February 2012

    Early registration 20 February 2012

    Conference 22-24 March 2012

    PAPER SUBMISSION

    Proceedings will be published by TAIST Tokyo Tech Program, National

    Science and Technology Development Agency (NSTDA). The first page

    should include the paper title, the names and the complete mailing

    addresses of all authors, and the e-mail address of the corresponding

    author. Each paper should consist of up to 200-word abstract, up to 5

    keywords. All the text, figures and reference must be between 4-6

    double-column A4 pages with font size of 10 points. Authors MUST use

    IEEE manuscript submission guidelines (available at

    http://www.ieee.org/authors.html) for their initial submissions. All

    papers must be submitted electronically in PDF format only, using the

    conference management tool. The submitted papers must not be published

    or under consideration to be published elsewhere.

    For further information, Please contact

    Thanaruk Theeramunkong

    Sirindhorn International Institute of Technology,

    Thammasat University, Thailand

    Tel: +66-2-501-3505 ext. 2004

    Fax: +66-2-501-3505 ext. 2001

    Email: icictes12 at siit.tu.ac.th


    Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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