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CCIE 2010 - 2010 International Conference on Computing, Control and Industrial Engineering (CCIE 2010)
Website http://www.ccieconf.org/ |
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Category CCIE 2010
Deadline: December 06, 2009 | Date: June 05, 2010
Venue/Country: Wuhan, China
Updated: 2010-06-04 19:32:22 (GMT+9)
Call For Papers - CFP
Computing and control are becoming increasingly interesting to both the academic researchers and management practitioners in the filed of industrial engineering. It is essential to corporate computing and control into industrial engineering from the theoretical viewpoint; it is also absolutely essential to the survival, growth and prosperity of any company to have some means to improve its efficiency and effect. As China's domestic economy are fast expanding, more and more enterprises and scholars in and outside China are paying high attentions to application of computing and control theory into production..It is our pleasure to invite you to participate in the 1st International Conference on computing, control and Industrial Engineering (CCIE 2010), which will be held at Wuhan, China from June 5 to June 6, 2010. This conference provides an idea-exchange and discussion platform for the world’s engineers and academia, where internationally recognized researches and practitioners share cutting-edge information, address the hottest issue intelligent Design, Computer-Aided Design and Intelligent Manufacturing, explore new technologies, exchange and build upon ideas. And provide researchers and practitioners interested in new information technologies an opportunity to highlight control research directions, novel applications, and a growing number of relationships between intelligent design, Human-machine interaction in digital processes, production planning and Control, applications, evaluation and tools.News: CCIE 2010 will be published by IEEE Computer Society's Conference Publishing Services (CPS).CPS will arrange for indexing through IEE INSPEC, EI (Compendex), Thomson ISI, and other indexing servicesNews: CCIE 2010 has been technical co-sponsored by IEEE Hong Kong Section RACS Chapter.Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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