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SISC 2013 - 2013 IEEE 44th Semiconductor Interface Specialists Conference (SISC)
Website www.ieeesisc.org |
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Category SISC 2013
Deadline: February 15, 2013 | Date: December 04, 2013-December 07, 2013
Venue/Country: Arlington, U.S.A
Updated: 2012-04-01 17:38:02 (GMT+9)
Call For Papers - CFP
The SISC is a workshop-style conference that provides a forum for device engineers, solid state physicists, and materials scientists to discuss topics of common interest both formally through invited and contributed presentations, and informally during a variety of events including a poster presentation session. The conference will be held immediately prior to the IEDM. SISC is sponsored by the IEEE Electron Device Society.The program includes talks from all areas of MOS science and technology, including but not limited to the following:SiO2 and high-k dielectrics on Si and their interfacesInsulators on high-mobility and alternative substrates (SiGe, Ge, III-V, SiC, etc.)MOS gate stacks with metal gate electrodesStacked dielectrics for non-volatile memoryOxide and interface structure, chemistry, defects, and passivation: Theory and experimentElectrical characterization, performance and reliability of MOS-based devicesSurface cleaning technology and impact on dielectrics and interfacesDielectrics on nanowires, nanotubes, and grapheneOxide electronics and multiferroicsInterfaces in photovoltaics, e.g. Si passivationKeywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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