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    VAMOS' 2010 - 4th International Workshop on Variability Modelling of Software-intensive Systems (VaMoS'2010)

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    Website http://www.vamos-workshop.net/ | Want to Edit it Edit Freely

    Category VAMOS' 2010

    Deadline: November 10, 2009 | Date: January 27, 2010

    Venue/Country: Pohang, South Korea

    Updated: 2010-06-04 19:32:22 (GMT+9)

    Call For Papers - CFP

    Fourth International Workshop on Variability Modelling of Software-Intensive Systems

    "Celebrating 20 Years of Feature Models"

    Pohang, South Korea - January 27-29, 2010

    with Keynotes by Prof. K. Kang and Prof. K. Czarnecki

    http://www.vamos-workshop.net

    == Call for Papers ==

    Managing variability is a major issue in the development, maintenance and evolution

    of software-intensive systems. To be managed effectively and efficiently,

    variability must be explicitly modelled. Numerous variability modelling techniques

    have been proposed both by academia and industry.

    The aim of the VaMoS workshop series is to bring together researchers from various

    areas of variability modelling to discuss advantages, drawbacks and complementarities

    of various approaches and to present new results for variability modelling and

    management.

    == Workshop Format ==

    VaMoS 2010, like the three previous VaMoS workshops, will be a highly interactive

    event. Each session will be organized such that discussions among presenters of papers,

    discussants and other participants are stimulated. Typically, after a paper is

    presented, it is immediately discussed by pre-assigned discussants, after which a free

    discussion involving all participants follows. Each session is closed by a general

    discussion of all papers presented in the session.

    The workshop language is English.

    Attendance is restricted to authors of accepted papers, invited speakers, organisers

    and PC members.

    == Topics (non-exclusive) ==

    -Modelling variability in functional, quality and economics requirements

    -Modelling variability in the architecture

    -Separation of Concerns

    -Feature oriented software development

    -Visualization of variability

    -Handling complexity

    -Formal reasoning and automated analysis on variability

    -Configuration in variability management

    -Application (e.g., embedded systems, information systems, service-based systems)

    -Tool support

    == Submissions ==

    We look forward to receiving the following types of submissions:

    Problem statements describing open issues of theoretical or practical nature.

    -Experience reports which report on positive or negative experiences.

    -Surveys and comparative studies that investigate pros, cons and complementarities of

    existing variability modelling approaches.

    -Research in progress including research results at a premature stage.

    -Vision papers stating where the research in the field should be heading towards.

    -Tool demonstrations describing the variability-related features of CASE tools.

    The length of the submitted papers should be between 4 and 8 pages in IEEE CS

    proceedings format. Details on how to submit will be available on the VaMoS web site:

    http://www.vamos-workshop.net

    == Publication ==

    The proceedings of the workshop will be published as a Research Report of

    the Institute for Computer Science and Business Information Systems (ICB) of

    the University of Duisburg-Essen (ISSN 1860-2770). Last editions of VaMoS are indexed

    in the DBLP repository: http://www.informatik.uni-trier.de/~ley/db/conf/vamos/index.html

    == Important Dates ==

    Submission deadline: November 10, 2009

    Notification of acceptance: December 10, 2009

    VaMoS workshop: January 27-29, 2010

    == Venue ==

    VaMoS will be hosted by the Pohang University of Science and Technology (POSTECH), Korea.

    Steering Committee

    Ulrich Eisenecker University of Leipzig, Germany

    Patrick Heymans PReCISE, University of Namur, Belgium

    Andreas Metzger University of Duisburg-Essen, Germany

    Klaus Pohl University of Duisburg-Essen, Germany

    Kyo-Chul Kang Pohang Univ. of Science and Technology, Korea

    General Chair

    Kyo-Chul Kang Pohang Univ. of Science and Technology, Korea

    Program co-chairs

    Don Batory University of Texas, USA

    David Benavides University of Seville, Spain

    Organising Committee

    Kim Lauenroth University of Duisburg-Essen, Germany

    Kwanwoo Lee Hansung University, Korea

    Program Committee

    Vander Alves University of Brasilia, Brasil

    Sven Apel University of Passau, Germany

    Danilo Beuche Pure::Systems, Germany

    J�rgen Börstler Ume� University, Sweden

    Manfred Broy TU Munich, Germany

    Goetz Botterweck LERO, Ireland

    Oscar DÃ?az Universidad del PaÃ?s Vasco, Spain

    Alessandro Fantechi Universita' degli Studi di Firenze, Italy

    Stefania Gnesi ISTI-CNR, Italy

    AnirÃ?ddhÄ? GokhÄ?lé Vanderbilt University, USA

    Paul Gruenbacher Johannes Kepler Universitat Linz, Austria

    Ã?ystein Haugen University of Oslo & SINTEF, Norway

    Mei Hong Beijing University , China

    Tomoji Kishi Japan Advanced Institute of Science and Technology

    Stan Jarzabek National University of Singapore

    Roberto Lopez-Herrejon Johannes Kepler Universitat Linz, Austria

    Tomi Männistö Helsinki University of Technology, Finland

    Vicente Pelechano Universidad Politécnica de Valencia, Spain

    Antonio Ruiz-Cortés Universidad de Sevilla, Spain

    Camille Salinesi University of Paris 1-Sorbonne, France

    Klaus Schmid University of Hildesheim, Germany

    Doug Schmidt Vanderbilt University, USA

    Steffen Thiel Furtwangen University of Applied Sciences, Germany

    Pim van den Broek University of Twente, The Netherlands

    Frank van der Linden Philips, The Netherlands

    Matthias Weber Carmeq GmbH, Germany

    Jules White Vanderbilt University, USA


    Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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