RTP 2010 - 18th International Conference on Advanced Thermal Processing of Semiconductors (RTP 2010)
View: 4443
Website http://www.ieee-rtp.org/ |
Edit Freely
Category RTP 2010
Deadline: May 31, 2010 | Date: September 28, 2010
Venue/Country: Gainesville, U.S.A
Updated: 2010-06-04 19:32:22 (GMT+9)
Call For Papers - CFP
CALL FOR PAPERS18th IEEE Conference on Advanced Thermal Processing of SemiconductorsIEEE RTP 2010Hilton University of Florida Conference Center in GainesvilleSeptember 28 - October 1, 2010Conference Chair:Bo LojekATMELRegional Chairs: Europe America Far EastErik Rosseel Jeff Gelpey Masayasu TanjyoIMEC Mattson Technology Nissin Ion EquipmentIEEE RTP'2010 is a conference for engineers, scientists, managers and marketing specialists working in thermal processing of semiconductors, manufacturing, simulation and equipment development. The goal is to provide a comprehensive overview of current and future directions of thermal processing technology and processing systems. The primary emphasis will be on the state-of-the-art tools and RTP and Furnace concepts and methods as they apply to commercial ULSI processing. Papers are sought in the following areas: Thermal Processing of Nanomaterials and NanostructuresAdvanced Dielectric Formation and RTPCVDDiffusion, Dopant Activation and Junction FormationApplication of Thermal Processes to Front and Back End ManufacturingRTP and Advanced Thermal Processing EquipmentTemperature Measurement and ControlHeat Transfer in MicrostructuresModeling and Simulation of Thermal ProcessesStrategies for RTP and Furnace Processing in the Manufacturing EnvironmentAll submissions should include title, list of authors with affiliations, and an abstract not exceeding 300 words. Abstracts should be submitted electronically as a Microsoft Word or Adobe PDF document. To submit a paper, please follow instructions in the folder Submit Abstract. Accepted papers will be published in the archival conference proceeding, with no page limit.DEADLINE FOR ABSTRACT SUBMISSIONS IS MAY 31, 2010.All correspondence should be addressed to any member of the Conference Steering Committee or to:IEEE RTP 2010 Conferencehttp://www.IEEE-RTP.org
Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
Disclaimer: ourGlocal is an open academical resource system, which anyone can edit or update. Usually, journal information updated by us, journal managers or others. So the information is old or wrong now. Specially, impact factor is changing every year. Even it was correct when updated, it may have been changed now. So please go to Thomson Reuters to confirm latest value about Journal impact factor.