ICTM 2009 - 2009 International Conference on Test and Measurement (ICTM 2009)

Website www.ictm2009.cn/ | Edit Freely

Category ICTM 2009

Deadline: November 05, 2009 | Date: December 05, 2009

Venue/Country: HongKong, Hong Kong

Updated: 2010-06-04 19:32:22 (GMT+9)

Call For Papers - CFP

2009 International Conference on Test and Measurement (ICTM 2009) will be held in Hong Kong, December 5-6, 2009

We are delighted to invite you to participate in 2009 International Conference on Test and Measurement in Hong Kong, December 5-6, 2009.The objective of ICTM 2009 is to provide a forum for researchers, educators, engineers, and government officials involved in the general areas of Test and Measurement to disseminate their latest research results and exchange views on the future research directions of these fields.

ICTM 2009 Proceedings has been published by IEEE, All accepted paper will be published by IEEE, Which will be indexed by EI Compendex and ISTP

ICTM 2009 Submssion System, The paper submission date is Nov 5, 2009

https://www.easychair.org/login.cgi?conf=ictm2009

ICTM 2009 已??入IEEE 官方会?列表

http://www.ieee.org/web/conferences/search/

所有?用?文被IEEE 出版，被EI 和ISTP ?索。?文集会前出版。

The conference provides an interdisciplinary forum for exchanging views on education, educational technologies, engineering education etc... Papers are solicited in the following and related areas:

　 ★ Test theories and its application

　 ★ Acoustic and ultrasonic measurement

　 ★ ADC,DAC and data acquisition

　 ★ Artificial intelligence ,nerve net work

　 ★ Electronic -magnetic measurement

　 ★ Environment measurement

　 ★ Flow distribution and visualization

　 ★ Image and information processing

　 ★ Laser and optics fiber

　 ★ Light and radiation detection

　 ★ Mechanical measurement

　 ★ MEMS and NEMS

　 ★ Microwave measurement

　 ★ Noise and vibration measurement

　 ★ Nondestructive testing

　 ★ On-line test

　 ★ Remote sensing and telemeter

　 ★ Robotics

　 ★ Sensors and transducers

　 ★ Industrial autoimmunization

　 ★ Control theories and technologies

　 ★ Automatic adjustment and measurement

　 ★ Others

Sponsored and Supported

IEEE

IEEE Instrumentation and Measurement Society

Intelligent Information Technology Application Research Association, Hong Kong

Wuhan Institute of Technology, China