RFID-TA 2010 - 2010 IEEE International Conference on Rfid-Technology and Applications (RFID-TA)
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Website http://www.ieee-rfidta.org/ |
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Category RFID-TA 2010
Deadline: January 30, 2010 | Date: June 17, 2010
Venue/Country: Guangzhou, China
Updated: 2010-06-04 19:32:22 (GMT+9)
Call For Papers - CFP
The IEEE International Conference on RFID-Technology and Applications 2010 (IEEE RFID-TA2010) will be held on June 17~19, 2010 in Guangzhou, China. This conference is organized by Sun Yat-sen University under the auspices of IEEE and the IEEE Technical Committee on RFID. IEEE RFID-TA2010 will provide a forum for the advancement of RFID technology and practice, and will aim to strengthen relations between industry, research laboratories and universities. Authors are invited to submit 6-page original papers in PDF format to present their latest research and applications in all areas of RFID.TOPICAL AREAS OF INTERESTTopic areas of interest include, but are not limited to:Antenna Theory & DesignCircuits and Architectures System Deployment & DesignRadio Frequency Investigation and UtilizationIntelligent RFIDRFID Middleware RFID ApplicationsRFID in the Internet of Things RFID and Sensor Integration RFID Information and Services Infrastructures RFID in Vehicle Identification and Tracking RFID in Food Safety and Quality Management RFID in ManufacturingRFID in Retail RFID in Supply Chain RFID in Inventory ControlRFID in Asset Tracking RFID in Warehousing and Airline Baggage RFID in Pharmaceutical and HealthcareRFID in LibrariesSecurity and Privacy RFID in Passport IdentificationRFID in Anti-CounterfeitingRFID in Authentication and Authorization Logistics with RFID.IMPORTANT DATESPaper submission due (6-page in PDF format): Jan 30, 2010 Notifications of acceptance sent: Apr 1, 2010 Publication-ready versions uploaded: May 1, 2010 Conference: Jun 17~19, 2010 SUBMISSION INSTRUCTIONSPlease refer to the PAPER SUBMISSION link on the Conference homepage. Submitted papers should be written in English and follow IEEE format for conference papers. The conference proceedings will be published by IEEE. All papers will be searchable by IEEE Xplore and EI Compendex (pending approval). More information is available from the Conference homepage: www.ieee-rfidta.org/2010. For enquiries and assistance, please contact IEEE RFID-TA2010 Organizing Committee in Guangzhou: rfidtaoc
mail.sysu.edu.cn
Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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