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MCC'10 2010 - The Second IEEE International Workshop on Multimedia Computing and Communications (MCC 2010)
Website www.ifp.illinois.edu/~yunfu2/CfP/MCC10-cfp.html |
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Category MCC'10 2010
Deadline: March 22, 2010 | Date: August 02, 2010
Venue/Country: ETH Zurich, Switzerland
Updated: 2010-06-04 19:32:22 (GMT+9)
Call For Papers - CFP
The Second IEEE International Workshop on Multimedia Computing and Communications (MCC'10)August 2 - 5, 2010
ETH Zurich, Switzerland
In conjunction with IEEE International Conference on Computer Communications and Network (ICCCN) 2010
Call For Paper: http://www.ifp.illinois.edu/~yunfu2/CfP/MCC10-cfp.html
Topics covered include, but are not limited to, the following:
* Multimedia content analysis, representation, and understanding
* Multimedia management in social networking environment
* Multimedia data mining and fusing, indexing and retrieval
* Sensorial data processing for interactive games
* Content, user, computation, and network aware media engineering
* Multimedia summarization and abstraction
* Intelligent audio-video surveillance and other security-related applications
* Multimedia and multimodal user interfaces and interaction models
* Soft-biometrics from multimedia computing
* Multimedia in mobile and smart environment
* Internet human computer interaction
* Image/video processing and analysis
* Image filtering and enhancement, such as noise reduction, edge enhancement, contrast enhancement, color processing
* Image restoration, multiframe image restoration
* Image/video format conversion including de-interlacing, scaling and super-resolution, and frame rate conversion
* Motion detection and estimation
* Image/video segmentation and tracking
* Image/video stabilization
* Stereoscopic and 3D processing
* 3DTV
IMPORTANT DATES:
Paper submission deadline March 15, 2010
Author notification April 30, 2010
Camera-ready paper May 14, 2010
Program Chairs:
Yun (Raymond) Fu, University at Buffalo (SUNY), USA
Fan Zhai, Texas Instruments, USA (fzhai
ti.com)Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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