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ARFTG 2010 - 75th ARFTG Microwave Measurement Conference ARFTG 2010
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Category ARFTG 2010
Deadline: December 14, 2009 | Date: May 28, 2010
Venue/Country: Anaheim, U.S.A
Updated: 2010-06-04 19:32:22 (GMT+9)
Call For Papers - CFP
ARFTG will hold its 75th Microwave Measurement Conference at the Hilton Anaheim in Anaheim, California on Friday, May 28th, 2010 as part of Microwave Week 2010. This week includes the International Microwave Symposium (IMS, www.ims2010.org), and the Radio Frequency Integrated Circuits symposium (RFIC, www.rfic2010.org).The main theme of the 75th ARFTG Conference is the measurement of analog and digitally-modulated signals used in communications systems.
Technical papers describing original work in the measurement and analysis of modulated signals for communications at RF, microwave or millimeter-wave frequencies are solicited. Topics of particular interest include:
? Vector Signal Measurements and Complex Waveform Analysis
? Nonlinear Measurement Techniques in Time Domain and Envelope Domain
Leonard Hayden
President
Cascade Microtech
Ronald Ginley
Vice-President, Electronic
Communications, Membership
NIST
Nick Ridler Secretary, Publicity
National Physical Lab
Ken Wong Treasurer
Agilent Technologies, Inc.
David Walker Treasurer
NIST
Brett Grossman Exhibits
Intel Corp.
David Blackham Publications
Agilent Technologies, Inc.
Uwe Arz Standards
PTB
Dominique Schreurs Education
K. U. Leuven
Rusty Myers Sponsors
Maury Microwave Corp.
Mohamed Sayed Technical
MMS
Jon Martens Technical
Anritsu
Jean-Pierre Teyssier Workshops
University of Limoges
John Wood Awards, Nominations
Freescale Semiconductor, Inc.
Charles Wilker MTT-S Liaison
Dupont Superconductivity
Ex-Officio Members
? Applications of Digital Signal Processing to Communications Signal Measurements
? On-Wafer Measurements
? Measurements in Fixtures, particularly for High-Power Applications
? Nonlinear Modeling, and Linearization and Predistortion Techniques
? Other areas of RF, microwave, or millimeter wave measurement
Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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