MDPLE 2012 - THIRD International Workshop on Model-Driven Product Line Engineering (MDPLE)
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Category MDPLE 2012
Deadline: April 16, 2012 | Date: July 02, 2012
Venue/Country: Lyngby, Denmark
Updated: 2012-03-13 18:58:17 (GMT+9)
Call For Papers - CFP
International Workshop on Model-Driven Product Line Engineering(MDPLE 2012)Workshop held in conjunction with ECMFA 2012Lyngby, Denmark, 2nd July 2012Workshop website: http://lero.ie/mdple2012/
== Workshop Summary and Goals ==The fundamental premise of product line engineering (PLE) is that theinvestment in a family of products pays off later by allowingsystematic, efficient derivation of products. This should be automatedas much as possible, which can be achieved via model-driven engineering(MDE) techniques.Research in PLE and MDE has many intersections. PLE leverages MDE tospecify variability, domain concepts, configurations and more. (Semi-)automated product derivation requires mappings between the models ondifferent abstraction layers and model transformations to derive animplementation from a configuration.In addition, latest research shows the increasing need for concepts todeal with very large and evolving systems. Product lines can no longerrely on an immutable scope but need to be considered as evolving systemswhich can span over organizational boundaries. Thus, there is a need toinvestigate latest concepts from MDE like model-driven evolution andco-evolution, consistency management, multi-paradigm modelling, etc.In this workshop we aim to bring together researchers and practitionersto foster the exchange of concepts and ideas between them to addressthese challenges.== Workshop Topics ==We are interested in the application of concepts from MDE to ProductLine Engineering, including (but not limited to):Modelling of software product linesVariability modellingEvolution of product linesComplexity handling and scalabilityAutomated and interactive tool-supportFeature-oriented / Aspect-oriented approachesMultiple binding time and run-time variabilityAdvanced approaches and process models (e.g.. multiple product lines and organisations)Integrated handling of multiple modelsVariability-aware validation approachesWe explicitly encourage submission of case studies and experiencereports from industry where such techniques have been applied inindustrial practice and on a larger scale.== Important Dates ==Paper submission: 16th April 2012Notification of acceptance: 14th May 2012Camera-ready version: 30th May 2012Workshop: 2nd July 2012== Submissions ==We are seeking for two types of submissions:Regular papers (max. 12 pages) presenting original research and/or experience reports andShort papers (max. 6 pages) describing ongoing research, new results, and future trends.All papers submitted to the workshop must be unpublished original workand must not have been submitted anywhere else for publication.Submissions will be selected based on the relevance to the workshoptopics and the suitability to trigger discussions. Submissions should besubmitted as PDF in Springer LNCS style viahttps://www.easychair.org/conferences/?conf=ecmfa-workshops2012
under the track "Model-driven Product Line Engineering". Accepted paperswill be published in a long-term archive chosen by the main conference,either ACM DL or CEUR proceedings (seehttp://www2.imm.dtu.dk/conferences/ECMFA-2012/workshops/
).== Program Committee ==Jan Bosch, Chalmers University of Technology, SEManfred Broy, TU Munich, DEAnders Caspar, Ericsson, SEDeepak Dhungana, Siemens CT, ATHerman Hartmann, University of Groningen, NLOystein Haugen, Univ. of Oslo and SINTEF, NODong Li, FISCAN, CNRoberto Lopez-Herrejon, JKU Linz, ATLinda Northrop, SEI, USRichard Paige, University of York, UKRick Rabiser, JKU Linz, ATJuha E. Savolainen, Danfoss Power Electronics, DKKlaus Schmid, University of Hildesheim, DESteffen Thiel, Furtwangen University of Applied Sciences, DESalva Trujillo, IKERLAN, ES and the workshop organisers.== Organizers ==Goetz Botterweck, Lero, Univ. of Limerick, IEAndreas Pleuss, Lero, Univ. of Limerick, IEJulia Rubin, IBM Haifa Research Lab, ILAndreas Rummler, SAP, DE
Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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