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    CSICS 2011 - IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS 2011 )

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    Website www.csics.org | Want to Edit it Edit Freely

    Category CSICS 2011

    Deadline: April 20, 2011 | Date: October 16, 2011

    Venue/Country: Waikoloa, U.S.A

    Updated: 2010-06-04 19:32:22 (GMT+9)

    Call For Papers - CFP

    The CSIC Symposium is the preeminent international forum on developments in integrated circuits using compound semiconductors such as GaAs, SiGe and other materials. Coverage embraces all aspects of the technology from materials issues and device fabrication, through IC design and testing, high volume manufacturing, and system applications.
    Conference Keywords:compound, semiconductors, integrated circuits, csics, gaas, ic, compound semiconductors, electron devices, gan, inp, power amplififers, milimeter wave
    Conference Focus:Application,Scientific/Academic
    WWW URL:http://www.csics.org/
    CFP URL:http://www.csics.org/
    From its beginning in 1978 as the GaAs IC symposium, CSICS has evolved to become the preeminent international forum for developments in compound semiconductor integrated circuits, embracing GaAs, InP, GaN, SiGe, and more recently, CMOS technology. Coverage includes all aspects of the technology, from materials issues and device fabrication, through IC design and testing, high volume manufacturing, and system applications. The IEEE Compound Semiconductor IC Symposium (CSICS) provides the ideal forum to present your latest results in high-speed digital, analog, microwave/millimeter wave, mixed mode, and optoelectronic integrated circuits. First-time papers concerned with the utilization and application of InP, GaAs, SiGe, GaN and other compound semiconductors in military and commercial products are invited. Specific technical areas of interest include:
    ? Innovative RFIC Device & Circuit Concepts
    ? Millimeter-wave/High-Speed CMOS IC
    ? Circuit Design & Fabrication
    ? Manufacturing Technology & Cost Issues
    ? CAD/CAM/CAT Tools & Techniques
    ? IC Testing & Methodology
    ? Packaging Technology
    ? Reliability
    ? Advanced Device Applications
    ? System Applications (e.g., wireless, vehicular, RADAR, military)
    ? Optoelectronic and OEIC applications

    Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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