IKM 2010 - The Second International Workshop on Interesting Knowledge Mining - IKM 2010
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Category IKM 2010
Deadline: May 01, 2010 | Date: August 16, 2010
Venue/Country: Seoul, South Korea
Updated: 2010-06-04 19:32:22 (GMT+9)
Call For Papers - CFP
The Second International Workshop on Interesting Knowledge Mining - IKM 2010 In conjunction with NCM 2010
August 16-18, 2010, Seoul , Korea
Call for Papers
Sponsored By IEEE Computer Society
# Program Committee Chair
# Li-Shiang Tsay (North Carolina A&T State University , USA)
# Zbigniew W. Ras (University of North Carolina at Charlotte, USA)
# Seunghyun Im (University of Pittsburgh at Johnstown, USA)
#
#
# Papers Due: ** May 1 **, 2010
# Published by IEEE CS Press
# Contact: iwikm10
gmail.com
#
# Workshop Website: http://www.pitt.edu/~sim/iwikm10
Scope and Topics
The IKM Workshop focuses on issues of discovering interesting and actionable knowledge from data. Theoretical advances, algorithms and systems, and application cases that make efforts to derive interesting knowledge from data are welcome contributions.
One of the main goals of KDD is to find nuggets of useful knowledge that could influence or help users in a decision making process. This task can be viewed as searching in an immense space for possible workable, concrete, and profitable strategies to the decision-maker. In the last decade, KDD algorithms have made a tremendous progress and have been demonstrated to be of significant value in a variety of real-world applications. Nevertheless, there is a gap between the discovered patterns and the formulated solutions. Currently, this gap is filled by manual or semi-automatic analysis, which is time consuming, biased, limits the efficiency of KDD overall process and capabilities.
The workshop invites papers on all aspects of diminishing the gap between the discovered results and actual action plans, including, but not limited to:
? Intelligent Agents
? Intelligent Information Systems
? Knowledge Representation and Integration
? Knowledge Discovery and Data Mining
? Knowledge Visualization
Important Dates:
Submission Deadline: May 1, 2010
Authors Notification: May 20, 2010
Notification of Paper Acceptance: May 25, 2010
Registration/Camera-ready of Accepted Papers: May 25 - June 10, 2010
Conference Dates: August 16-18, 2010
Program Committee Chairs:
Li-Shiang Tsay (North Carolina A&T State University , USA)
Zbigniew W. Ras (University of North Carolina at Charlotte, USA)
Seunghyun Im (University of Pittsburgh at Johnstown, USA)
Program Committee:
Aijun An ( York Univ. , Canada )
Annalisa Appice (Univ. of Bari, Italy)
Longbing Cao ( University of Technology , Sydney , Australia )
Bruno Cremilleux (Univ. de Caen, France)
Alfredo Cuzzocrea (Univ. of Calabria, Italy)
Agnieszka Dardzinska ( Bialystok Technical Univ. , Poland )
Jitender S. Deogun ( Univ. of Nebraska , USA )
Tapio Elomaa ( Tampere Univ. of Technology , Finland )
Floriana Esposito ( University of Bari , Italy )
Liqiang Geng (NRC Institute for Information Technology)
Salvatore Greco (Univ. of Catania, Italy)
Jerzy Grzymala-Busse ( University of Kansas , USA )
Mirsad Hadzikadic ( Univ. of North Carolina at Charlotte , USA )
Mila Kwiatkowska (Thompson Rivers Univ., Canada )
Chao-Lin Liu ( National Chengchi University , Taiwan )
Jiming Liu ( Hong Kong Baptist University , Hong Kong )
Jean-Marc Petit (LIRIS, INSA Lyon , France )
Jan Rauch ( Univ. of Economics , Prague , Czech Republic )
itschard/" class="p-link">Gilbert Ritschard ( Univ. of Geneva , Switzerland )
Dominik Slezak ( Univ. of Warsaw , Poland )
Shusaku Tsumoto ( Shimane Univ. , Japan )
Angelina Tzacheva ( Univ. of South Carolina Upstate , USA )
Djamel A. Zighed (Univ. Lyon , France )
Yiyu Yao ( Univ. of Regina , Canada )
Ning Zhong (Maebashi Institute of Technology , Japan )
Style Files for Paper Submission
IEEE Computer Society Proceedings Manuscript Formatting Guidelines
DOC: http://www.aicit.org/niss/sample.doc
PDF: http://www.aicit.org/niss/sample.pdf
Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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