ETS 2009 - ETS 2009 14th European Test Symposium

Website http://www.ieee-ets.org | Edit Freely

Category ETS 2009

Deadline: January 26, 2009 | Date: May 25, 2009

Venue/Country: Sevilla, Spain

Updated: 2010-06-04 19:32:22 (GMT+9)

Call For Papers - CFP

J.L. Huertas Diaz ¨C CNM (E)

O. Novak - Czech Tech. Univ. (Cz)

Program Chair / Vice Chair:

J.-P. Teixeira ¨C IST/TUL, INESC-ID (P)

E. Gramatova ¨C Slovak Acad. Sc. (SK)

Topic Chairs:

B. Becker ¨C U. Freiburg (D)

S. Hellebrand ¨C U. Paderborn (D)

H. Kerkhoff ¨C U. Twente (NL)

E. Larsson ¨C Linköping U. (S)

R. Leveugle ¨C TIMA (F)

P. Muhmenthaler ¨C Infineon (D)

N. Nicolici ¨C McMaster U. (CAN)

M. Renovell ¨C LIRMM (F)

Industrial Relations Chair:

P. Harrod - ARM Ltd (UK)

Publication Chair:

C. Metra ¨C U. Bologna (I)

Panel Chair:

H.-J. Wunderlich ¨C U. Stuttgart (D)

Tutorial Chair:

P. Girard ¨C LIRMM (F)

Embedded Tutorial Chair:

P. Prinetto ¨C Politecnico di Torino (I)

ETS Fringe Workshops:

B. Al-Hashimi ¨C U. Southampton (UK)

Ph.D. Forum Chair:

I. Polian ¨C U. Freiburg (D)

Regional Liaisons:

L. Carro ¨C UFRGS (BR)

A. Singh ¨C Auburn U. (USA)

A. Osseiran ¨C Edith Cowan U. (AUS)

S. Kajihara ¨C Kyushu IT (J)

Program Committee:

M. Abadir, USA L. Miclea, RO

R. Aitken, USA S. Mir, F

Z. Al-Ars, NL S. Mitra, USA

D. Appello, I Y. Miura, J

F. Azais, F F. Novak, SLO

M. Azimane, NL O. Novak, CZ

L. Balado, E A. Orailoglu, USA

A. Benso, I S. Ozev, USA

G. Carlsson, S A. Pataricza, H

K. Chakrabarty,USA F. Poehl, D

W. Daehn, D I. Polian, D

R. Dorsch, D I. Pomeranz, USA

M.-L. Flottes, F J. Raik, EE

H. Fujiwara, J J. Rajski, USA

F. Fummi, I A. Richardson, UK

D. Gizopoulos, GR J. Rivoir, D

E, Gramatova, SK B. Rouzeyre, F

S. Hamdioui, NL A. Rubio, E

M. Hirech, USA A. Rueda, E

A. Hlawiczka, PL K.K. Saluja, USA

M. S. Hsiao, USA P. Sanchez, E

P. Hughes, UK S. Sattler, D

A. Ivanov, CAN J. Segura, E

S. Kajihara, J J.-P. Teixeira, P

A. R. Kapur, USA N. Touba, USA

A. Krasniewski, PL J. Tyszer, PL

B. Kruseman, NL R. Ubar, EE

S. Kundu, USA B. Vermeulen, NL

M. Lubaszewski, BR C. Wegener, D

Y. Makris, USA X. Wen, J

H. Manhaeve, B C.-W. Wu, TW

E.J. Marinissen, B M. Zwolinski, UK

M. Abadir, USA L. Miclea, RO

Steering Committee:

Chair: H.-J. Wunderlich ¨C U. Stuttgart (D)

Al-Hashimi, UK Z. Peng, S

B. Becker, D P. Prinetto, I

J. Figueras, E M. Renovell, F

C. Landrault, F M. Sonza Reorda, I

E.J. Marinissen, NL J.-P. Teixeira, P

P. Muhmenthaler, D Y. Zorian, USA

Organizing Committee:

A. Rueda - Finance

G. Huertas - Proceedings

D. Vazquez - Local Arrangement

E. Peralias &

A. Acosta - Registration

G. Leger - Audio/visual

S. Sanchez - Web

Preliminary Call for Papers

The IEEE European Test Symposium (ETS) is Europe¡¯s premier forum dedicated to presenting and discussing scientific results, emerging ideas, practical applications, hot topics, and new trends in the area of electronic-based circuit and system testing. In 2009, ETS will take place in the nice town of Seville, Andaluc¨ªa, in southern Spain. ETS¡¯09 is being organized by Instituto de Microelectr¨®nica de Sevilla (CSIC and Univ. de Sevilla), and is sponsored by the Test Technology Technical Council (TTTC) of the IEEE Computer Society.

You are invited to participate and submit your contributions to ETS¡¯09. The areas of interest of ETS¡¯09 include (but are not limited to) the following topics:

Automatic Test Generation

Fault Modeling and Simulation

Current-Based Test

Power Issues in Test

Thermal Test

Delay and Performance Test

High-Speed IO/Interconnect Test

Signal Integrity Test

Nanometer Technologies Test

ATE Hardware and Software

Standards in Testing

Test(ability) Synthesis

Built-In Self Test (BIST)

Design for Test(ability) (DfT)

Test Data Compression

On-Line Test

Self-Repair Methodologies

Test of Reconfigurable Systems

Analog, Mixed-Signal, RF Test

Memory Test and Repair

Microprocessor Test

GALS Test

MEMS Test

Digital Power Supply Testing

Failure Analysis

Diagnosis and Debug

Design Verification and Validation

Lifetime Test

Test Quality and Reliability

Yield Analysis and Enhancement

Defect and Fault Tolerance

Board and System Test

Embedded Systems Test

High-Level DfT and TPG

System-on-Chip (SoC) Test

System-in-Package (SiP) Test

Publications ¨C ETS¡¯09 will produce a Formal Proceedings, published by the IEEE Computer Society, and a Web-Based Electronic Informal Digest of the selected papers. The best contributions will be selected for submission to regular issues of the ¡°Journal of Electronic Testing: Theory and Applications¡± (JETTA), published by Springer. ETS¡¯09 will present a Best Paper Award at ETS¡¯10.

Submissions ¨C ETS¡¯09 seeks original, unpublished contributions of the following types:

Scientific papers, presenting novel and complete research work

Workshop-type papers, including emerging ideas and practical case studies

Vendor Session presentations, focusing on new features of test-related products

Proposals for panels, embedded tutorials, and other special sessions.

Detailed submission instructions, including selection criteria and publication policies, for the various types of contributions are posted on the ETS web page.

IEEE TTTC Test Technology Educational Program (TTEP) tutorials on test technology topics will be offered during ETS¡¯09. Tutorial proposals should be submitted according to TTEP 2009 submission deadlines (http://computer.org/tab/tttc/teg/ttep).

As a new initiative for ETS¡¯09, a Ph.D. Forum will be organized. Moreover, the ETS¡¯09 organizing committee would like to encourage the organization of fringe workshops and will provide extensive support for the organization of such events. Full details can be found on the ETS web page.

Key Dates:

¡¤ Submission deadline: December 7, 2008

¡¤ Notification of acceptance: February 16, 2009

¡¤ Camera-ready manuscript : March 16, 2009

Further Information:

Jos¨¦ Lu¨ªs Huertas ¨C General Chair

IMSE-CNM, Univ. Sevilla

Avda. Reina Mercedes S/N

41012 Sevilla, Spain

Tel.: +34-95-505-6666

Fax: +34-95-505-6692

Email: huertasimse.cnm.es

J. Paulo Teixeira ¨C Program Chair

IST, Tech. Univ. Lisbon, INESC-ID

R. Alves Redol, 9

1000-029 Lisboa, Portugal

Tel.: +351-21 31 00 254

Fax: +351-21 314 58 43

E-mail: paulo.teixeiraist.utl.pt

Visit the ETS web page at: http://www.ieee-ets.org