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    MELT 2010 - The Third Workshop on Mobile Entity Localization and Tracking (MELT)

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    Website mass2010.soe.ucsc.edu | Want to Edit it Edit Freely

    Category MELT 2010

    Deadline: June 18, 2010 | Date: November 08, 2010

    Venue/Country: San Francisco, U.S.A

    Updated: 2010-06-04 19:32:22 (GMT+9)

    Call For Papers - CFP

    We are pleased to announce the 3rd MELT Workshop to be held at the the 7th IEEE International Conference on Mobile Ad-hoc and Sensor Networks. MELT 2010 will be held on the opening day of the conference, November 8, 2010. Please see our Call for Papers for more information.

    Location-awareness is a key component for achieving context-awareness. Recent years have witnessed an increasing trend of location-based services and applications. In most cases, however, location information is limited by the accessibility to Global Navigation Satellite Systems (GNSS), largely unavailable for indoor or underground facilities and unreliable in urban environments. Much research has been done, in both the sensor network community and the ubiquitous computing community, to provide techniques for localization and tracking in hybrid or GNSS-challenged environments. Novel applications based on ad-hoc localization and real-time tracking of mobile entities are growing as a result of these technologies. It is time to bring leaders from both the academic and industry research communities to discuss challenging and open problems, to evaluate various approaches, to bridge the gap between theory and applications, and to envision new research opportunities in MELT.

    After two successful workshops on this topic (MELT 2008 and MELT 2009), this workshop will continue to provide a forum for state-of-the-art technologies in mobile localization and tracking and novel applications and services based on location tracking. Both theoretical research driven by applications and system implementation with theoretical foundations are especially encouraged for this interactive and interdisciplinary workshop. The one-day workshop will have a combination of invited talks/panels, technical presentations and discussions.


    Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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