MLDM 2018 - 14th International Conference on Machine Learning and Data Mining MLDM 2018
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Website www.mldm.de |
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Category Machine Learning; Data Mining; Classification; Image Mining; Big Data; Clustering; Frequent Item Set Mining; Time-Series Mining; Pattern Recognition
Deadline: January 15, 2018 | Date: July 14, 2018-July 17, 2018
Venue/Country: New York, U.S.A
Updated: 2017-08-13 19:10:30 (GMT+9)
Call For Papers - CFP
The Aim of the ConferenceThe aim of the conference is to bring together researchers from all over the world who deal with machine learning and data mining in order to discuss the recent status of the research and to direct further developments. Basic research papers as well as application papers are welcome.« topTopics of the conferenceAll kinds of applications are welcome but special preference will be given to multimedia related applications, applications from live sciences and webmining.Paper submissions should be related but not limited to any of the following topics:association rulescase-based reasoning and learningclassification and interpretation of images, text, videoconceptional learning and clusteringGoodness measures and evaluaion (e.g. false discovery rates)inductive learning including decision tree and rule induction learningknowledge extraction from text, video, signals and imagesmining gene data bases and biological data basesmining images, temporal-spatial data, images from remote sensingmining structural representations such as log files, text documents and HTML documentsmining text documentsorganisational learning and evolutional learningprobabilistic information retrievalSampling methodsSelection with small samplessimilarity measures and learning of similaritystatistical learning and neural net based learningvideo miningvisualization and data miningApplications of ClusteringAspects of Data MiningApplications in MedicineAutoamtic Semantic Annotation of Media ContentBayesian Models and MethodsCase-Based Reasoning and Associative MemoryClassification and Model EstimationContent-Based Image RetrievalDecision TreesDeviation and Novelty DetectionFeature Grouping, Discretization, Selection and TransformationFeature LearningFrequent Pattern MiningHigh-Content Analysis of Microscopic Images in Medicine, Biotechnology and ChemistryLearning and adaptive controlLearning/adaption of recognition and perceptionLearning for Handwriting RecognitionLearning in Image Pre-Processing and SegmentationLearning in process automationLearning of internal representations and modelsLearning of appropriate behaviourLearning of action patternsLearning of OntologiesLearning of Semantic Inferencing RulesLearning of Visual OntologiesLearning robotsMining Images in Computer VisionMining Images and TextureMining Motion from SequenceNeural MethodsNetwork Analysis and Intrusion DetectionNonlinear Function Learning and Neural Net Based LearningReal-Time Event Learning and DetectionRetrieval MethodsRule Induction and GrammarsSpeech AnalysisStatistical and Conceptual Clustering MethodsStatistical and Evolutionary LearningSubspace MethodsSupport Vector MachinesSymbolic Learning and Neural Networks in Document ProcessingTime Series and Sequential Pattern MiningAudio MiningCognition and Computer VisionClusteringClassification & PredictionStatistical LearningAssociation RulesTelecommunicationDesign of ExperimentStrategy of ExperimentationCapability IndicesDeviation and Novelty DetectionControl ChartsDesign of ExperimentsCapability IndicesConceptional LearningGoodness Measures and Evaluation (e.g. false discovery rates)Inductive Learning Including Decision Tree and Rule Induction LearningOrganisational Learning and Evolutional LearningSampling MethodsSimilarity Measures and Learning of SimilarityStatistical Learning and Neural Net Based LearningVisualization and Data MiningDeviation and Novelty DetectionFeature Grouping, Discretization, Selection and TransformationFeature LearningFrequent Pattern MiningLearning and Adaptive ControlLearning/Adaption of Recognition and PerceptionLearning for Handwriting RecognitionLearning in Image Pre-Processing and SegmentationMining Financial or Stockmarket DataMining Motion from SequenceSubspace MethodsSupport Vector MachinesTime Series and Sequential Pattern MiningDesirabilitiesGraph MiningAgent Data MiningApplications in Software TestingAuthors can submit their paper in long or short version.Long PaperThe paper must be formatted in the Springer LNCS format. They should have at most 15 pages. The papers will be reviewed by the program committee. Accepted long papers will be published by Springer Verlag in the LNAI Series in the book Advances in Data Mining, edited by Petra Perner.Short PaperShort papers are also welcome and can be used to describe work in progress or project ideas. They can have 5 to max. 15 pages, formatted in Springer LNCS format. Accepted short papers will be presented as poster in the poster session. They will be published in a special poster proceedings book.« topProgram CommitteeChair Petra Perner IBaI Leipzig, GermanyCommittee Sergey Ablameyko Belarus State University, BelarusReneta Barneva The State University of New York at Fredonia, USAMichelangelo Ceci Universtiy of Bari, ItalyPatrick Bouthemy INRIA VISTA, FranceXiaoqing Ding Tsinghua University, ChinaChristoph F. Eick Universtiy of Houston, USAAna Fred Technical University of Lisboa, PortugalGiorgio Giacinto University of Cagliari, ItalyMakato Haraguchi Hokkaido University of Sapporo, JapanDimitris Karras Chalkis Institute of Technology, GreeceAdam Krzyzak Concordia University, CanadaThang V. Pham University of Amsterdam, The NetherlandsLinda Shapiro University of Washington, USATamas Sziranyi MTA-SZTAKI, HungaryFrancis E.H. Tay National University of Singapore, SingaporeAlexander Ulanov HP Labs, RussiaZeev Volkovich ORT Braude College of Engineering, IsraelPatrick Wang Northeastern University, USAAn industrial exhibition running in connection with the conference will give you the opportunity to look at new trends and systems in industry and to present your research to industry.
Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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