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    HVC 2010 - Haifa Verification Conference 2010

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    Website www.research.ibm.com/haifa/conferences/hvc2010 | Want to Edit it Edit Freely

    Category HVC 2010

    Deadline: July 16, 2010 | Date: October 05, 2010-October 07, 2010

    Venue/Country: IBM Haifa Labs, Israel

    Updated: 2010-06-19 21:36:40 (GMT+9)

    Call For Papers - CFP

    HVC 2010 is the sixth in the series of annual conferences dedicated to advancing the verification and testing of both hardware and software. The conference provides a forum for academia, industry, and the research and development community to share their work, exchange ideas, and discuss the challenges and future directions of verification for hardware, software, and hybrid systems.

    Academic research in the verification of systems is generally divided into two paradigms - formal verification and dynamic verification (testing). Within each paradigm, different algorithms and techniques are used for hardware and software systems. Yet, at their core, all of these techniques aim to achieve the same goal of ensuring the correct functionality of a complicated system. HVC is the only conference that brings together researchers from all four fields, thereby encouraging the migration of methods and ideas between domains. To this end, we are announcing a special interest in hybrid methods for this year's conference. We encourage the submission of works that exemplify the successful integration of ideas from different domains of expertise.

    The conference will involve the presentation of original, peer reviewed, technical papers and lectures by invited industrial and academic guests. Technical papers will be published in Springer's Lecture Notes in Computer Science series (LNCS). Selected papers will be considered for a special issue of the STTT journal. The event will take place at the IBM Research Lab in Haifa, located on the University of Haifa campus, Mount Carmel, Haifa, Israel.


    Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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