WACV 2011 - IEEE Workshop on Applications of Computer Vision (WACV) 2011
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Website vision.cs.byu.edu/wacv2011 |
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Category WACV 2011
Deadline: August 26, 2010 | Date: January 05, 2011-January 07, 2011
Venue/Country: Hawaii, U.S.A
Updated: 2010-06-25 18:55:36 (GMT+9)
Call For Papers - CFP
Computer Vision has become increasingly important in real world systems forcommercial, industrial and military applications. Computer Vision relatedtechnologies have started migrating from academic institutions to industriallaboratories, and onward into deployable systems. The goal of this workshop isto bring together an international cadre of academic, industrial, and governmentresearchers, and companies applying vision techniques.Topics include (but are not limited to)Industrial Inspection/ManufacturingFace DetectionFace RecognitionFingerprintsBiometrics FusionRoad/Traffic Analysis3D modelingImage-based Rendering for EntertainmentMotion/Stereo processing/segmentationReal-time TrackingGraphics Recognition/Engineering DrawingsClassification/RecognitionHuman Motion Analysis/CaptureDocument AnalysisSecurity/SurveillanceGesture/Hand RecognitionMedical AnalysisAugmented RealityPerformance Evaluation (of any vision application)Human-Computer InteractionScientific Imaging ApplicationsVisual Navigation and Station KeepingRobotics ApplicationsImage/Video Indexing and RetrievalVision for EntertainmentPerception Aids for the HandicappedUnderwater Industrial ApplicationsThe workshop will have 6-page papers, which may be presented as either oral and poster presentations (extra pages will be $100 a page, up to an 8-page maximum). The workshop, in conjunction with the rest of the Winter Vision Meetings, will also have a demonstration session. The WACV proceedings will be published electronically on a conference CD-ROM and on IEEExplore.WACV will also include a "Development" abstract track where companies can submit a 1-2 page abstract of their vision-related product or services. These will be reviewed by a subset of the program committee but not held to the same scientific/research standards of a full paper. Rather they are meant to help introduce the community to the product or application space. Abstracts may be selected for either oral or poster presentation. Abstracts (from either demos or products) will be included in the electronic proceedings CD-ROM.
Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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