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    HASE 2010 - The 12th IEEE International High Assurance Systems Engineering Symposium (HASE 2010)

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    Website http://web.mst.edu/~hase/hase2010/ | Want to Edit it Edit Freely

    Category HASE 2010

    Deadline: July 12, 2010 | Date: November 01, 2010-November 04, 2010

    Venue/Country: San Jose, U.S.A

    Updated: 2010-07-07 12:01:59 (GMT+9)

    Call For Papers - CFP

    The 12th IEEE International High Assurance Systems Engineering Symposium

    (HASE) http://web.mst.edu/~hase/hase2010/index.html

    Co-Located with the 21st IEEE International Symposium on Software

    Reliability Engineering (ISSRE) http://www.issre2010.org/

    November 1-4, 2010

    San Jose, CA, USA

    Call for Contributions

    The IEEE International Symposium on High Assurance Systems Engineering

    is a forum for discussion of systems and software engineering approaches

    to achieving high assurance systems. The focus is on integrated

    approaches for assuring reliability, availability, integrity, privacy,

    confidentiality, safety, and real-time performance of complex systems;

    and methods for assessing assurance levels of these systems to a high

    degree of confidence. Technical and experience papers on algorithms,

    policies, middleware, tools, and models for high assurance systems

    development, verification and validation, and assessment are welcome.

    Topics of interest for the symposium include, but are not limited to:

    * Design and development of highly reliable, survivable, secure, safe,

    and time-assured systems

    * Integrated system reliability, availability, security, safety, and

    timing analysis and evaluation methods

    * Formal specification, validation, testing, and model checking for high

    assurance systems

    * High assurance software architectures and design

    * Transformation-based and evolutionary-based system development

    * Reconfigurable system design for evolving high assurance requirements

    * Dynamic monitoring and adaptation for run-time assurance

    * High assurance information/knowledge systems and data grids

    * High assurance embedded systems, ubiquitous systems, and sensor

    networks

    * High assurance web services

    * Extending web service specifications for reliability, safety,

    security, privacy and other QoS properties

    * Case studies, experiments, and tools for high assurance systems

    Research Papers:

    HASE 2010 is soliciting original, unpublished research papers. The

    length is limited to 10 pages, in IEEE style.

    Fast Abstracts:

    A fast abstract is a lightly reviewed, two-page technical article that

    requires a short talk at HASE. The length is limited to two pages, in

    IEEE style.

    All submissions must be written in English and formatted according to

    the IEEE formatting guidelines for conference papers.

    All papers and fast abstracts must be submitted through the web-based

    submission system, in PDF format. At least one author of each accepted

    research paper or fast abstract is required to pay the full registration

    fee to the conference.

    Each accepted paper or fast abstract must be presented in person by the

    author or one of the authors.

    Panel Proposals:

    Proposals for panels are being solicited. Panel proposals should be

    submitted by email, to sedighsatmst.edu, and should include the panel

    title and scope, and organizers' contact information.

    Important Dates:

    July 5, 2010 Abstract registration deadline

    July 12, 2010 Full paper submission deadline

    July 30, 2010 Fast abstract and panel proposal deadline

    August 16, 2010 Author notification

    August 30, 2010 Camera-ready submission and author registration

    deadline

    General Inquiries:

    For more detailed information, please visit the symposium website at:

    http://web.mst.edu/~hase/hase2010/index.html

    For further information or inquiries, please contact:

    Sahra Sedigh, Program Chair of HASE 2010 (sedighsatmst.edu)


    Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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