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    IEEE MASS 2010 - Call for Participation and Demos IEEE MASS 2010

    View: 1852

    Website mass2010.soe.ucsc.edu | Want to Edit it Edit Freely

    Category Mobile computing ;Sensor

    Deadline: July 30, 2010 | Date: November 08, 2010-November 11, 2010

    Venue/Country: San Francisco, U.S.A

    Updated: 2010-07-19 11:25:36 (GMT+9)

    Call For Papers - CFP

    CALL FOR PARTICIPATION

    IEEE MASS 2010

    7th IEEE International Conference on Mobile Ad-hoc

    and Sensor Systems

    https://mass2010.soe.ucsc.edu/

    November 8-12, 2010 - San Francisco, CA, USA

    Co-sponsored by the IEEE Computer Society Technical Commitee on

    Distributed Processing and IEEE Computer Society Technical Commitee on

    Simulation

    CONFERENCE SITE:

    The 7th IEEE International Conference on Mobile Ad-hoc and Sensor

    Systems (IEEE MASS 2010) will be held in San Francisco, California, USA.

    SCOPE:

    Wireless ad-hoc communication has applications in a variety of

    environments, such as conferences, hospitals, battlefields and

    disaster-recovery/rescue operations, and is also being actively

    investigated as an alternative paradigm for Internet connectivity in

    both urban and rural areas. Wireless sensor and actuator networks are

    also being deployed for enhancing industrial control processes and

    supply-chains, and for various forms of environmental monitoring. The

    IEEE MASS 2010 aims at addressing advances in research on multi-hop

    ad-hoc and sensor networks, covering topics ranging from technology

    issues to applications and test-bed development. Please keep checking

    the IEEE MASS 2010 web-space for more information and regular updates.

    REGISTRATION:

    Registration to IEEE MASS is now available at the conference website.

    Early registration ends on September 3rd.

    WORKSHOPS:

    - The Third Workshop on Mobile Entity Localization and Tracking (MELT)

    - The Second Workshop on SCEnarios for Network Evaluation Studies (SCENES)

    - The Sixth Workshop on Wireless and Sensor Network Security (WSNS)

    - The Fourth Workshop on Enabling Technologies and Standards for

    Wireless Mesh Networking (MESHTECH)

    - The First BioSense Workshop: Networking and Environmental Sensing meet

    Epidemiology and Biology

    - The Second International Workshop on Intelligent Vehicular Networks

    (InVeNet)

    CFP DEMOS ? IMPORTANT DATES:

    Abstract submission deadline: 30 July 2010

    Acceptance notification: 27 August 2010

    Camera-ready submission: 10 September 2010

    IEEE MASS 2010: 8-12 November 2010

    ORGANIZATION COMMITTEE:

    GENERAL CO-CHAIRS

    Mario Gerla, University of California, Los Angeles

    Katia Obraczka, University of California, Santa Cruz

    PROGRAM CO-CHAIRS

    Guohong Cao, Pennsylvania State University

    Prasant Mohapatra, University of California, Davis

    TPC SUB-AREA CHAIRS

    - Protocols and Cross-Layer Technologies

    Ahmed Helmy, University of Florida

    - Systems, and applications

    Chenyang Lu, Washington Unviersity in St. Louis

    - Algorithms and theory

    Dong Xuan, Ohio State University

    - Reliability, security and privacy

    Radha Poovendran, University of Washington

    WORKSHOP CO-CHAIRS

    Cedric Westphal, DoCoMo Labs

    Christine Pepin, DoCoMo Labs

    DEMO CHAIR

    Rajeev Koodli, Starent Networks

    Marcelo Dias Amorim, LIP 6, Universite' Paris 6

    WEB CHAIR

    Venkatesh Rajendran, Wionics

    FINANCE AND REGISTRATION CHAIR

    Zhen Jiang, West Chester University

    PUBLICATION CHAIR

    Dajin Wang, Montclair State University

    PUBLICITY CHAIR

    Aline Carneiro Viana, INRIA

    LOCAL ARRANGEMENTS CO-CHAIRS

    Kumar Viswanath, NTT Labs

    Ignacio Solis, PARC

    STEERING COMMITTEE CHAIR

    Dharma P. Agrawal, University of Cincinnati

    CHAIR OF IEEE TC ON DISTRIBUTED PROCESSING

    Jie Wu, US National Science Foundation

    CHAIR OF IEEE TC ON SIMULATION

    Dave Cavalcanti, Phillips Research


    Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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