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MSM 2011 - Microscopy of Semiconducting Materials 2011 (MSM-XVIII)
Website www.msm2011.org |
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Category MSM 2011
Deadline: December 19, 2010 | Date: April 04, 2011-April 07, 2011
Venue/Country: Cambridge, U.K.
Updated: 2010-12-13 18:51:44 (GMT+9)
Call For Papers - CFP
The conference will focus on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the applications of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques including scanning probe microscopy and X-ray topography and diffraction will also be featured. Developments in materials science and technology covering the complete range of elemental and compound semiconductors will be described.Key datesAbstract submission deadline: 19 December 2010Early registration deadline: 17 February 2011Registration deadline: 27 March 2011Paper submission deadline: 4 April 2011Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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