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    IWSCN 2011 - 2011 3rd International Workshop on Security and Communication Networks (IWSCN)

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    Website iwscn2011.hig.no | Want to Edit it Edit Freely

    Category IWSCN 2011

    Deadline: February 27, 2011 | Date: May 18, 2011-May 20, 2011

    Venue/Country: Gjøvik, Norway

    Updated: 2011-02-03 11:35:28 (GMT+9)

    Call For Papers - CFP

    IWSCN 2011 brings together researchers, developers, practitioners, and users interested in the area of security and communication networks. The conference focuses on how to design, build, and evaluate future networks that are secure, reliable, and provide high and predictable performance. The aim of the workshop is to serve as a forum for presenting current and future work, as well as to exchange research ideas in these fields. We hereby encourage parties to submit papers to IWSCN 2011. Topics of interest include, but are not limited to:

    Network and Service Dependability

    Quality of Service (QoS)

    Quality of Experience (QoE)

    Security in Wired and Wireless Networks

    Computer Forensics

    Intrusion Detection

    Data Collection

    Privacy and Anonymity

    Trust Management

    Quantitative Assessment

    Network Modeling and Simulation

    Network Performance Measurement

    Network Management

    Critical Infrastructure Protection

    Biometrics and Image Analysis

    Authors should submit electronic versions of their papers using the Easy Chair system. Submitted papers should be original and contain contributions of theoretical, experimental or application nature, or be unique experience reports. Papers must be submitted no later than February 27, 2011 and electronic submission in PDF is required. Authors are requested to follow the standard IEEE double column format. Papers will be evaluated for originality, significance, clarity, and soundness, and will be reviewed by at least three independent reviewers. The page limit for camera-ready papers is six pages. Accepted papers will be published in a paper proceeding and will also appear in IEEE Xplore.

    Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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