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    OSEMA 2011 - OSEMA 2011 : International Workshop on Ontology and Semantic web for Manufacturing

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    Website www.osema.org.ve/ | Want to Edit it Edit Freely

    Category OSEMA 2011

    Deadline: February 28, 2011 | Date: May 28, 2011-June 02, 2011

    Venue/Country: HERAKLION, Greece

    Updated: 2011-02-07 16:21:45 (GMT+9)

    Call For Papers - CFP

    1st International Workshop on Ontology and Semantic web for

    Manufacturing (OSEMA 2011)

    http://www.osema.org.ve/

    at the 8th Extended Semantic Web Conference (ESWC 2011)

    http://www.eswc2011.org

    May 29th or 30th, Hersonissos, Crete, Greece

    SUBMISSION DEADLINE February 25

    The necessity of continuous innovation and improvement in productivity

    presents the manufacturing industry with huge challenges. Not only is

    there a demand for more creative designs, there is also the need to

    improve support for streaming designs into production lines. Delivering

    products to the market involves the flow of information between several

    steps ranging from design to prototyping, manufacturing and

    distributing. Interoperability across software supporting these

    activities is notoriously limited.

    A semantic layer in the manufacturing sector may facilitate scenarios

    such as the development of new products considering restrictions and

    limitations of the manufacturing facility on the one hand and on the

    other hand considering customer needs. Here, the design of new the

    product is instantiated into a product ontology. This ontology has

    metadata including features related to materials, colors, dimensions,

    etc. Such features reflect customer preferences, but imply the necessity

    of processes to acquire and manage them. In a second step into this

    scenario, the ontology of the manufacturing process can be instantiated

    by extracting features from the product ontology, thus enabling e.g. the

    automatic inference of manufacturability of the product.

    In this vein, ontologies and the Semantic Web facilitate the creation of

    such metadata and enable reasoning over product and process restriction.

    Although several approaches of this kind have been proposed, none of

    them are widely accepted so far, which means that there are still

    several issues requiring extensive discussion and consensus in the

    community. Therefore, it is necessary to provide a discussion scenario

    where theoretical positions, best practices, implementations, proposals

    of standards, and frameworks are presented. It will deserve special

    interest to discuss how the manufacturing industry can take advantage of

    Semantic Web technologies. OSEMA 2011 aims to provide such scenario.

    QUESTIONS AND TOPICS OF INTEREST

    - How can the Semantic Web support the development of new products?

    - Why CAD ontologies? Do we really need them?

    - Do we need one enterprise ontology, or a modular enterprise ontology?

    - Can OWL be used to represent processes in the manufacturing domain?

    - Knowledge management over the manufacturing “Know how”.

    - How can the versioning of products be managed? Can ontology help? How?

    - How can raw materials be semantically described?

    - Can there be an ontological framework for manufacturing so that

    designs and production are interoperable?

    - Semantic search over the manufacturing information space

    - How can tagging techniques be applied within the manufacturing domain?

    AUDIENCE

    We want to bring together researchers and practitioners active in the

    design, development, and application of ontologies and the Semantic Web

    in the manufacturing domain, as well as industrial representatives in

    Computer Aided Design (CAD), Computer Aided Process Planning (CAPP), and

    Computer Aided Manufacturing (CAM) industry who are interested in

    integrating the Product Life Cycle management into their software tools.

    IMPORTANT DATES

    Submission deadline: February 25, 2011

    Acceptance notification: April 1, 2011

    Camera-ready: April 15, 2011

    Workshop date: May 29 or 30, 2011

    SUBMISSION AND PROCEEDINGS

    Only electronic submissions will be considered. All submissions should

    be submitted in pdf format, to

    https://www.easychair.org/conferences/?conf=osema2011

    Submissions should not exceed 14 pages and should be formatted according

    to the LNCS Springer format

    (http://www.springer.com/east/home/computer/lncs?SGWID=5-164-7-72376-0).

    The workshop proceedings will both be uploaded to CEUR

    (http://ceur-ws.org/) and placed on electronic media for distribution at

    the conference.

    PROGRAM COMMITTEE

    1. Aristeidis Matsokis, Laboratory for Computer Aided Design and

    Production, Switzerland.

    2. Aziz Bouras, University Claude Bernard Lyon II, France.

    3. David Baxter, University of Cranfield, England

    4. Dong Yang, Shanghai jiao Tong University, China.

    5. Grubic Tonci, University of Cranfield, England.

    6. John Bateman, University of Bremen, Germany.

    7. Jürgen Angele, Ontoprise, Germany.

    8. Kristina Shea, Technische Universität München, Germany.

    9. Oliver Eck, Department of Computer Science, HTWG Konstanz, Germany.

    10. Parisa Ghoudous, University Claude Bernard Lyon I, France.

    11. Richard Gil Herrera, University Simón Bolivar. Venezuela.

    12. Sylvere Krima, National Institute of Standards and Technology

    (NIST), USA.

    13. Yuh-Jen Chen, National Kaohsiung First University of Science and

    Technology, Taiwan.

    ORGANIZING COMMITTEE

    * Alexander García Castro, University of Bremen, Germany/University of

    Arkansas, USA. Email: alexgarciacatgmail.com

    * Lutz Schröder, German Research Center for Artificial Intelligence

    (DFKI). Email: Lutz.Schroederatdfki.de

    * Carlos Toro, Vicomtech Research Centre / Donostia-San Sebastían,

    Spain. Email: ctoroatvicomtech.org

    * Luis Enrique Ramos García, University of Bremen, Germany. Email:

    s_7dns7ratuni-bremen.de


    Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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