WINC 2009 - Second IEEE International Workshop on Wireless Network Coding (WiNC 2009) Co-located with IEEE SECON 2009

Website http://www.ieee-secon.org/2009/winc/ | Edit Freely

Category WINC 2009

Deadline: March 27, 2009 | Date: June 22, 2009

Venue/Country: Rome, Italy

Updated: 2010-06-04 19:32:22 (GMT+9)

Call For Papers - CFP

Co-located with IEEE SECON 2009

Rome, Italy

June 22, 2009

http://www.ieee-secon.org/2009/winc/

Important Dates

Manuscript Submission Due: March 27, 2009

Acceptance Notification: April 30, 2009

Camera-Ready Paper Due: May 9, 2009.

We invite original, previously unpublished papers and research

contributions. We heartily encourage late-breaking results and early

stage research. Topics of interest include, but are not limited to:

* Wireless network coding

* Network coding with soft information

* Network coding in the physical layer

* Joint source and network coding in wireless networks

* Network coding and interference cancellation

* Network coding at the MAC layer

* Network coding and routing

* Error-correcting network coding in wireless networks

* Delay-aware and prioritized network coding

* Multi-path network coding

* Network information flow

* Network coding and block-markov coding

* Network coding in the presence of adversaries

* Secure network coding

* Implementation aspects of network coding

* Network coding systems

Workshop Organizers

Srihari Nelakuditi, University of South Carolina

Yunnan Wu, Microsoft Research

Technical Program Committee

Christina Fragouli, EPFL

Tracey Ho, California Institute of Technology

Sidharth Jaggi, Chinese University of Hong Kong

Gerhard Kramer, University of Southern California

Baochun Li, University of Toronto

Desmond Lun, University of South Australia

Mehul Motani, National University of Singapore

Srihari Nelakuditi, University of South Carolina

Alex Sprintson, Texas A&M University

Vladimir Stankovic, University of Strathclyde

Chih-Chun Wang, Purdue University

Joerg Widmer, DoCoMo Euro-Labs

Yunnan Wu, Microsoft Research

Edmund Yeh, Yale University