IWNS 2011 - Third International Workshop on Network Steganography - IWNS 2011
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Category IWNS 2011
Deadline: March 15, 2011 | Date: May 26, 2011-May 28, 2011
Venue/Country: Prague, Czech Republic
Updated: 2011-02-18 14:55:04 (GMT+9)
Call For Papers - CFP
Network steganography is a part of information hiding focused on modern networks and is a method of hiding secret data in users' normal data transmissions, ideally, so it cannot be detected by third parties. Steganographic techniques arise and evolve with the development of network protocols and mechanisms, and are expected to be used in secret communication or information sharing. Now, it becomes a hot topic due to the wide spread of information networks, e.g., multimedia services in networks and social networks.This year's workshop's main theme is network forensics.The workshop is dedicated to capture such areas of research as steganography, steganalysis (steganology), and digital forensics in the meaning of network covert channels, investigate the potential applications, and discuss the future research topics. Research themes of the workshop will include:Steganography and steganalysis (steganology)Covert/subliminal channelsNovel applications of information hiding in networksPolitical and business issues related to network steganographyInformation hiding in multimedia servicesDigital forensicsNetwork communication modelling from the viewpoint of steganography and steganalysisNew methods for detecting and eliminating network steganographyThe first workshop was held in Wuhan (China) in November 2009 and second workshop in Nanjing (China) in November 2010.ChairsKrzysztof Szczypiorski, Warsaw University of Technology, Poland (e-mail: ksz{at}tele.pw.edu.pl)Shiguo Lian, France Telecom R&D (Orange Labs) Beijing, China (e-mail: shiguo.lian{at}orange-ftgroup.com)Wojciech Mazurczyk, Warsaw University of Technology, Poland (e-mail: wmazurczyk{at}tele.pw.edu.pl)List of Program Committee members (tentative)Krzysztof Cabaj, Warsaw University of Technology, PolandSteve Chapin, Syracuse University, USACostas Constantinou, University of Birmingham, UKNicolas T. Courtois, University College London, UKJana Dittmann, Otto-von-Guericke University of Magdeburg, GermanyMichael Fisk, University of California San Diego, USAStefan Katzenbeisser, Technische Universität Darmstadt, GermanyPaul Kiddie, University of Birmingham, UKJerzy Konorski, Gdansk University of Technology, PolandIgor Kotenko, Russian Academy of Sciences, Russia Zbigniew Kotulski, Warsaw University of Technology and IPPT PAN, PolandChristian Kraetzer, Otto-von-Guericke University of Magdeburg, GermanyDeepa Kundur, Texas A&M University, USAMiroslaw Kutylowski, Wroclaw Universtity of Technology, PolandKe Liao, Institute of Electronics, Chinese Academy of Sciences, ChinaGuangjie Liu, Nanjing University of Science and Technology, ChinaDavid Llamas, University of St Andrews, UKJozef Lubacz, Warsaw University of Technology, PolandNorka Lucena, Syracuse University, USASymeon Papavassiliou, National Technical University of Athens, GreeceJosef Pieprzyk, Macquarie University, AustraliaJanusz Stoklosa, Poznan University of Technology, PolandJinwei Wang, The 28th Research Institute of CETC, ChinaJozef Wozniak, Gdansk University of Technology, PolandKonrad Wrona, NATO C3 Agency, NetherlandsXiaoyi Yu, Peking University, ChinaSebastian Zander, Swinburne University of Technology Melbourne, Australiahttp://stegano.net/workshop/
Papers will be accepted based on peer review and should contain original, high quality work. All papers must be written in English. The details on the length and template will be provided later.Submission page: same system as for ICTSM2011.The extended versions of high-quality papers selected from the workshop will be published in a special issue of: Networking and Electronic Commerce Journal or the Telecommunication Systems Journal.Dates Manuscript Due: 15.03.2011 Acceptance Notification: 05.04.2011 Final Manuscript Due: 15.04.2011
Keywords: Accepted papers list. Acceptance Rate. EI Compendex. Engineering Index. ISTP index. ISI index. Impact Factor.
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